What von Neumann did not say about multiplexing beyond gate failures - The gory details

Valeriu Beiu*, Walid Ibrahim, Sanja Lazarova-Molnar

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

This paper presents an exact reliability analysis of von Neumann multiplexing using majority gates of fan-in A = 3,5,7,9,11, and the corresponding minimum redundancy factors R = 6,10,14,18,22. Such results are extremely important for a deeper understanding of von Neumann multiplexing (and its variations), especially when considering the expected unreliable behavior of future nano-devices and interconnects. The analysis confirms and augments well-known theoretical results, and is exact as being obtained using exhaustive counting. The extension of the analysis to the device level will allow us to characterize von Neumann multiplexing with respect to device failures for the first time. The results are very timely and are also explaining a strange (non-linear) behavior of von Neuman multiplexing reported two years ago (based on extensive Monte Carlo simulations).

Original languageEnglish
Title of host publicationComputational and Ambient Intelligence - 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, Proceedings
Number of pages10
Publication date1. Dec 2007
Pages487-496
ISBN (Print)9783540730064
Publication statusPublished - 1. Dec 2007
Event9th International Work-Conference on Artificial Neural Networks, IWANN 2007 - San Sebastian, Spain
Duration: 20. Jun 200722. Jun 2007

Conference

Conference9th International Work-Conference on Artificial Neural Networks, IWANN 2007
Country/TerritorySpain
CitySan Sebastian
Period20/06/200722/06/2007
SeriesLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume4507 LNCS
ISSN0302-9743

Fingerprint

Dive into the research topics of 'What von Neumann did not say about multiplexing beyond gate failures - The gory details'. Together they form a unique fingerprint.

Cite this