The k.p Method: Electronic Properties of Semiconductors

Lok C. Lew Yan Voon^*
, Morten Willatzen

^*Corresponding author for this work

Wright State University

Research output: Book/report › Monograph › Research › peer-review

Original language	English

Place of Publication	Berlin
Publisher	Springer
Number of pages	445
ISBN (Print)	978-3-540-92871-3
ISBN (Electronic)	978-3-540-92872-0
DOIs	https://doi.org/10.1007/978-3-540-92872-0
Publication status	Published - Jul 2009

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10.1007/978-3-540-92872-0

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