| Original language | English |
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| Place of Publication | Berlin |
|---|---|
| Publisher | Springer |
| Number of pages | 445 |
| ISBN (Print) | 978-3-540-92871-3 |
| ISBN (Electronic) | 978-3-540-92872-0 |
| DOIs | |
| Publication status | Published - Jul 2009 |
The k.p Method: Electronic Properties of Semiconductors
Lok C. Lew Yan Voon*, Morten Willatzen
*Corresponding author for this work
Research output: Book/report › Monograph › Research › peer-review