The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

Christoph Lemke; Till Leißner; Alwin Klick; Jacek Fiutowski; Jörn W. Radke; Martin Thomaschewski; Jakob Kjelstrup-Hansen; Horst-Günter Rubahn; Michael Bauer

doi:10.1007/s00340-013-5737-2

The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

Christoph Lemke
, Till Leißner
, Alwin Klick
, Jacek Fiutowski
, Jörn W. Radke
, Martin Thomaschewski
, Jakob Kjelstrup-Hansen
, Horst-Günter Rubahn
, Michael Bauer

Christian-Albrechts-University of Kiel

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Two-photon photoemission electron microscopy
(2P-PEEM) is used to measure the real and imaginary
part of the dispersion relation of surface plasmon polaritons
at different interface systems. A comparison of calculated
and measured dispersion data for a gold/vacuum interface
demonstrates the capability of the presented experimental
approach. A systematic 2P-PEEM study on the dispersion
relation of dielectric-loaded gold surfaces shows how
effective the propagation of surface plasmon polaritons at a
gold/para-hexaphenylene interface can be tuned by
adjustment of the dielectric film thickness. Deviations of
the experimental results from effective index calculations
indicate the relevance of thin film peculiarities arising from
the details of the growth process and corroborate the need
of experimental analysis techniques for dispersion relation
measurements.

Original language	English
Journal	Applied Physics B
Volume	116
Issue number	3
Pages (from-to)	585-591
Number of pages	7
ISSN	0946-2171
DOIs	https://doi.org/10.1007/s00340-013-5737-2
Publication status	Published - 1. Sept 2014

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title = "The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces",

abstract = "Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.",

author = "Christoph Lemke and Till Lei{\ss}ner and Alwin Klick and Jacek Fiutowski and Radke, \{J{\"o}rn W.\} and Martin Thomaschewski and Jakob Kjelstrup-Hansen and Horst-G{\"u}nter Rubahn and Michael Bauer",

year = "2014",

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doi = "10.1007/s00340-013-5737-2",

language = "English",

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TY - JOUR

T1 - The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

AU - Lemke, Christoph

AU - Leißner, Till

AU - Klick, Alwin

AU - Fiutowski, Jacek

AU - Radke, Jörn W.

AU - Thomaschewski, Martin

AU - Kjelstrup-Hansen, Jakob

AU - Rubahn, Horst-Günter

AU - Bauer, Michael

PY - 2014/9/1

Y1 - 2014/9/1

N2 - Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.

AB - Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.

U2 - 10.1007/s00340-013-5737-2

DO - 10.1007/s00340-013-5737-2

M3 - Journal article

SN - 0946-2171

VL - 116

SP - 585

EP - 591

JO - Applied Physics B

JF - Applied Physics B

IS - 3

ER -

The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

Abstract

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