Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

Neal Fairley, Vincent Fernandez, Mireille Richard‐Plouet, Catherine Guillot-Deudon, John Walton, Emily Smith, Delphine Flahaut, Mark Greiner, Mark Biesinger, Sven Tougaard, David Morgan, Jonas Baltrusaitis*

*Corresponding author for this work

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The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framework. In particular, discussions arising from a series of workshops have been a significant source for developing the overall XPS data processing concept and are the motivation for creating this work. These workshops organized by the Institut des Matériaux Jean Rouxel (IMN), Nantes gather both experienced and novice users of XPS for a week of discourse in conceptual experiment design and the resulting data processing. However, the framework constructed and utilized within these workshops encouraged the dissemination of knowledge beyond XPS data analysis and emphasized the importance of a multi-disciplinary collaborative approach to surface analysis problem-solving. The material presented here embodies data treatment originating from data made available to the first CNRS Thematic Workshop presented at Roscoff 2013. The methodology described here has evolved over the subsequent workshops in 2016 and 2019 and currently represents the philosophy used in CasaXPS spectral data processing paradigm.

Original languageEnglish
Article number100112
JournalApplied Surface Science Advances
Number of pages9
Publication statusPublished - 1. Sept 2021

Bibliographical note

Publisher Copyright:
© 2021 The Authors


  • CasaXPS
  • Data processing
  • Molybdenum trisulfate
  • Peak fit
  • XPS


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