Structural and magnetic properties of Mn-implanted Si

Shengqiang Zhou*, K. Potzger, Gufei Zhang, A. Mücklich, F. Eichhorn, N. Schell, R. Grötzschel, B. Schmidt, W. Skorupa, M. Helm, J. Fassbender, D. Geiger

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Structural and magnetic properties in Mn-implanted, p -type Si were investigated. High resolution structural analysis techniques such as synchrotron x-ray diffraction revealed the formation of Mn Si1.7 nanoparticles already in the as-implanted samples. Depending on the Mn fluence, the size increases from 5 nm to 20 nm upon rapid thermal annealing. No significant evidence is found for Mn substituting Si sites either in the as-implanted or annealed samples. The observed ferromagnetism yields a saturation moment of 0.21 μB per implanted Mn at 10 K, which could be assigned to Mn Si1.7 nanoparticles as revealed by a temperature-dependent magnetization measurement.

Original languageEnglish
Article number085203
JournalPhysical Review B
Volume75
Issue number8
ISSN2469-9950
DOIs
Publication statusPublished - 7. Feb 2007

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