Spectroscopic ellipsometry of large area monolayer WS2and WSe2films

G. A. Ermolaev*, D. I. Yakubovsky, Y. V. Stebunov, A. A. Voronov, A. V. Arsenin, V. S. Volkov*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.

Original languageEnglish
Title of host publicationProceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019
EditorsValentyn Volkov, Alexey Nikitin, Aleksey V. Arsenin
Volume2359
PublisherAmerican Institute of Physics Inc.
Publication date22. Jun 2021
Article number020005
ISBN (Electronic)9780735441033
DOIs
Publication statusPublished - 22. Jun 2021
Event1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019 - Sochi, Russian Federation
Duration: 30. Sep 20194. Oct 2019

Conference

Conference1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019
Country/TerritoryRussian Federation
CitySochi
Period30/09/201904/10/2019
SponsorBeijing Graphene Institute, IMC Industrial Monitoring and Control, Neaspec GmbH
SeriesAIP Conference Proceedings
Volume2359
ISSN0094-243X

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