Spectroscopic ellipsometry of large area monolayer WS2and WSe2films

G. A. Ermolaev; D. I. Yakubovsky; Y. V. Stebunov; A. A. Voronov; A. V. Arsenin; V. S. Volkov

doi:10.1063/5.0054947

Spectroscopic ellipsometry of large area monolayer WS₂and WSe₂films

G. A. Ermolaev^*, D. I. Yakubovsky, Y. V. Stebunov, A. A. Voronov, A. V. Arsenin, V. S. Volkov^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.

Original language	English
Title of host publication	Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019
Editors	Valentyn Volkov, Alexey Nikitin, Aleksey V. Arsenin
Volume	2359
Publisher	American Institute of Physics Inc.
Publication date	22. Jun 2021
Article number	020005
ISBN (Electronic)	9780735441033
DOIs	https://doi.org/10.1063/5.0054947
Publication status	Published - 22. Jun 2021
Event	1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019 - Sochi, Russian Federation Duration: 30. Sep 2019 → 4. Oct 2019

Conference

Conference	1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019
Country/Territory	Russian Federation
City	Sochi
Period	30/09/2019 → 04/10/2019
Sponsor	Beijing Graphene Institute, IMC Industrial Monitoring and Control, Neaspec GmbH

Series	AIP Conference Proceedings
Volume	2359
ISSN	0094-243X

Documents & Links

10.1063/5.0054947

Cite this

Ermolaev, G. A., Yakubovsky, D. I., Stebunov, Y. V., Voronov, A. A., Arsenin, A. V., & Volkov, V. S. (2021). Spectroscopic ellipsometry of large area monolayer WS₂and WSe₂films. In V. Volkov, A. Nikitin, & A. V. Arsenin (Eds.), Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019 (Vol. 2359). [020005] American Institute of Physics Inc.. AIP Conference Proceedings Vol. 2359 https://doi.org/10.1063/5.0054947

Ermolaev, G. A. ; Yakubovsky, D. I. ; Stebunov, Y. V. et al. / Spectroscopic ellipsometry of large area monolayer WS₂and WSe₂films. Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019. editor / Valentyn Volkov ; Alexey Nikitin ; Aleksey V. Arsenin. Vol. 2359 American Institute of Physics Inc., 2021. (AIP Conference Proceedings, Vol. 2359).

@inproceedings{dfb6beadb9894d198f255850a38be49c,

title = "Spectroscopic ellipsometry of large area monolayer WS2and WSe2films",

abstract = "In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons. ",

author = "Ermolaev, {G. A.} and Yakubovsky, {D. I.} and Stebunov, {Y. V.} and Voronov, {A. A.} and Arsenin, {A. V.} and Volkov, {V. S.}",

note = "Funding Information: This research was funded by Russian Foundation for Basic Research (18-07-01379, 18-07-01339, 18-37-20061 and 18-29-02089). Publisher Copyright: {\textcopyright} 2021 Author(s).; 1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019 ; Conference date: 30-09-2019 Through 04-10-2019",

year = "2021",

month = jun,

day = "22",

doi = "10.1063/5.0054947",

language = "English",

volume = "2359",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics Inc.",

editor = "Valentyn Volkov and Alexey Nikitin and Arsenin, {Aleksey V.}",

booktitle = "Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019",

}

Ermolaev, GA, Yakubovsky, DI, Stebunov, YV, Voronov, AA, Arsenin, AV & Volkov, VS 2021, Spectroscopic ellipsometry of large area monolayer WS₂and WSe₂films. in V Volkov, A Nikitin & AV Arsenin (eds), Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019. vol. 2359, 020005, American Institute of Physics Inc., AIP Conference Proceedings, vol. 2359, 1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019, Sochi, Russian Federation, 30/09/2019. https://doi.org/10.1063/5.0054947

Spectroscopic ellipsometry of large area monolayer WS₂and WSe₂films. / Ermolaev, G. A.; Yakubovsky, D. I.; Stebunov, Y. V. et al.

Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019. ed. / Valentyn Volkov; Alexey Nikitin; Aleksey V. Arsenin. Vol. 2359 American Institute of Physics Inc., 2021. 020005 (AIP Conference Proceedings, Vol. 2359).

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Spectroscopic ellipsometry of large area monolayer WS2and WSe2films

AU - Ermolaev, G. A.

AU - Yakubovsky, D. I.

AU - Stebunov, Y. V.

AU - Voronov, A. A.

AU - Arsenin, A. V.

AU - Volkov, V. S.

PY - 2021/6/22

Y1 - 2021/6/22

N2 - In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.

AB - In the present study, we report on dispersion function over a spectral range of 300-1700 nm (i.e. 0.73-4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.

U2 - 10.1063/5.0054947

DO - 10.1063/5.0054947

M3 - Article in proceedings

AN - SCOPUS:85109417505

VL - 2359

T3 - AIP Conference Proceedings

BT - Proceedings of International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019

A2 - Volkov, Valentyn

A2 - Nikitin, Alexey

A2 - Arsenin, Aleksey V.

PB - American Institute of Physics Inc.

T2 - 1st International Congress on Graphene, 2D Materials and Applications, 2D MATERIALS 2019

Y2 - 30 September 2019 through 4 October 2019

ER -