Sampling criterion for EMC near field measurements

O. Franek*, M. Sørensen, H. Ebert, G. F. Pedersen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review


An alternative, quasi-empirical sampling criterion for EMC near field measurements intended for close coupling investigations is proposed. The criterion is based on maximum error caused by sub-optimal sampling of near fields in the vicinity of an elementary dipole, which is suggested as a worst-case representative of a signal trace on a typical printed circuit board. It has been found that the sampling density derived in this way is in fact very similar to that given by the antenna near field sampling theorem, if an error less than 1 dB is required. The principal advantage of the proposed formulation is its parametrization with respect to the desired maximum error in measurements. This allows the engineer performing the near field scan to choose a suitable compromise between accuracy and measurement time.

Original languageEnglish
Title of host publicationPIERS 2012 Kuala Lumpur - Progress in Electromagnetics Research Symposium, Proceedings
Number of pages4
Publication date12. Nov 2012
ISBN (Print)9781934142202
Publication statusPublished - 12. Nov 2012
EventProgress in Electromagnetics Research Symposium, PIERS 2012 Kuala Lumpur - Kuala Lumpur, Malaysia
Duration: 27. Mar 201230. Mar 2012


ConferenceProgress in Electromagnetics Research Symposium, PIERS 2012 Kuala Lumpur
CityKuala Lumpur
SponsorTELEKOM Malaysia, TELEKOM Malaysia Research and Development, Motorola Solutions, Malaysia Convention and Exhibition Bureau (MyCeb)
SeriesProgress in Electromagnetics Research Symposium


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