Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters

V. S. Bharath Kurukuru; Ahteshamul Haque; Mohammed Ali Khan; Arun Kumar Tripathy

doi:10.1109/ICPECA47973.2019.8975617

Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters

V. S. Bharath Kurukuru
, Ahteshamul Haque
, Mohammed Ali Khan
, Arun Kumar Tripathy

Jamia Millia Islamia
National Institute of Solar Energy (NISE)

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

This paper performs reliability analysis to achieve an undesirable trade-off among the current ratings, efficiency, and reliability of power modules in Voltage Source Converters (VSC). It investigates the aspects of reliability for Silicon Carbide (SiC) power modules, and estimate the lifetime, failure rate and efficiency of the power electronic converters used in a three-phase grid connected photovoltaic system. The reliability analysis is carried out by performing Ideal Component Testing (ICT), and Active Component Testing (ACT) under four different operating modes. The probability rate of the system failure for each operating mode is calculated using Markov chain process. Finally, the dependency of reliability and lifetime on the gate voltage is identified and the necessary measures are suggested to achieve an undesirable trade-off among the targeted current ratings, efficiency, and system reliability.

Original language	English
Title of host publication	2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings
Publisher	IEEE
Publication date	Nov 2019
Article number	8975617
ISBN (Electronic)	9781728139586
DOIs	https://doi.org/10.1109/ICPECA47973.2019.8975617
Publication status	Published - Nov 2019
Externally published	Yes
Event	2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings - New Delhi, India Duration: 16. Nov 2019 → 17. Nov 2019

Conference

Conference	2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings
Country/Territory	India
City	New Delhi
Period	16/11/2019 → 17/11/2019

Keywords

Lifetime
Meantime to failure (MTTF)
Power Modules
Reliability
Silicon Carbide (SiC)

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10.1109/ICPECA47973.2019.8975617

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@inproceedings{8189042184fb4ed091e34425548e5896,

title = "Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters",

abstract = "This paper performs reliability analysis to achieve an undesirable trade-off among the current ratings, efficiency, and reliability of power modules in Voltage Source Converters (VSC). It investigates the aspects of reliability for Silicon Carbide (SiC) power modules, and estimate the lifetime, failure rate and efficiency of the power electronic converters used in a three-phase grid connected photovoltaic system. The reliability analysis is carried out by performing Ideal Component Testing (ICT), and Active Component Testing (ACT) under four different operating modes. The probability rate of the system failure for each operating mode is calculated using Markov chain process. Finally, the dependency of reliability and lifetime on the gate voltage is identified and the necessary measures are suggested to achieve an undesirable trade-off among the targeted current ratings, efficiency, and system reliability.",

keywords = "Lifetime, Meantime to failure (MTTF), Power Modules, Reliability, Silicon Carbide (SiC)",

author = "\{Bharath Kurukuru\}, \{V. S.\} and Ahteshamul Haque and Khan, \{Mohammed Ali\} and Tripathy, \{Arun Kumar\}",

year = "2019",

month = nov,

doi = "10.1109/ICPECA47973.2019.8975617",

language = "English",

booktitle = "2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings",

publisher = "IEEE",

address = "United States",

note = "2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings ; Conference date: 16-11-2019 Through 17-11-2019",

}

Bharath Kurukuru, VS, Haque, A, Khan, MA & Tripathy, AK 2019, Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters. in 2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings., 8975617, IEEE, 2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings, New Delhi, India, 16/11/2019. https://doi.org/10.1109/ICPECA47973.2019.8975617

Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters. / Bharath Kurukuru, V. S.; Haque, Ahteshamul; Khan, Mohammed Ali et al.
2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings. IEEE, 2019. 8975617.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters

AU - Bharath Kurukuru, V. S.

AU - Haque, Ahteshamul

AU - Khan, Mohammed Ali

AU - Tripathy, Arun Kumar

PY - 2019/11

Y1 - 2019/11

N2 - This paper performs reliability analysis to achieve an undesirable trade-off among the current ratings, efficiency, and reliability of power modules in Voltage Source Converters (VSC). It investigates the aspects of reliability for Silicon Carbide (SiC) power modules, and estimate the lifetime, failure rate and efficiency of the power electronic converters used in a three-phase grid connected photovoltaic system. The reliability analysis is carried out by performing Ideal Component Testing (ICT), and Active Component Testing (ACT) under four different operating modes. The probability rate of the system failure for each operating mode is calculated using Markov chain process. Finally, the dependency of reliability and lifetime on the gate voltage is identified and the necessary measures are suggested to achieve an undesirable trade-off among the targeted current ratings, efficiency, and system reliability.

AB - This paper performs reliability analysis to achieve an undesirable trade-off among the current ratings, efficiency, and reliability of power modules in Voltage Source Converters (VSC). It investigates the aspects of reliability for Silicon Carbide (SiC) power modules, and estimate the lifetime, failure rate and efficiency of the power electronic converters used in a three-phase grid connected photovoltaic system. The reliability analysis is carried out by performing Ideal Component Testing (ICT), and Active Component Testing (ACT) under four different operating modes. The probability rate of the system failure for each operating mode is calculated using Markov chain process. Finally, the dependency of reliability and lifetime on the gate voltage is identified and the necessary measures are suggested to achieve an undesirable trade-off among the targeted current ratings, efficiency, and system reliability.

KW - Lifetime

KW - Meantime to failure (MTTF)

KW - Power Modules

KW - Reliability

KW - Silicon Carbide (SiC)

UR - https://www.scopus.com/pages/publications/85084444077

U2 - 10.1109/ICPECA47973.2019.8975617

DO - 10.1109/ICPECA47973.2019.8975617

M3 - Article in proceedings

BT - 2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings

PB - IEEE

T2 - 2019 International Conference on Power Electronics, Control and Automation, ICPECA 2019 - Proceedings

Y2 - 16 November 2019 through 17 November 2019

ER -

Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters

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