Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range

O Renault, Charlotte Zborowski, P Risterucci, C Wiemann, G Grenet, C M Schneider, Sven Mosbæk Tougaard

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Original languageEnglish
Article number011602
JournalApplied Physics Letters
Volume109
Issue number1
Number of pages5
ISSN0003-6951
DOIs
Publication statusPublished - 2016

Cite this

Renault, O., Zborowski, C., Risterucci, P., Wiemann, C., Grenet, G., Schneider, C. M., & Tougaard, S. M. (2016). Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range. Applied Physics Letters, 109(1), [011602]. https://doi.org/10.1063/1.4955427