Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films

Dahlang Tahir, Suhk Kun Oh, Hee Jae Kang, Sven Mosbæk Tougaard

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Abstract

Electronic and optical properties of Fe-Ni alloy thin films grown on Si (1 0 0) by ion beam sputter deposition were studied via quantitative analyses of reflection electron energy loss spectra (REELS). The analysis was carried out by using the QUASES-XS-REELS and QUEELS-ε(k,ω)-REELS softwares to determine the energy loss function (ELF) and the dielectric functions and optical properties by analyzing the experimental spectra. For Ni, the ELF shows peaks around 3.6, 7.5, 11.7, 20.5, 27.5, 67 and 78 eV. The peak positions of the ELF for Fe 28Ni 72 are similar to those of Fe 51Ni 49, even though there is a small peak shift from 18.5 eV for Fe 51Ni 49 to 18.7 eV for Fe 28Ni 72. A plot of n, k, ε 1, and ε 2 shows that the QUEELS-ε(k,ω)-REELS software for analysis of REELS spectra is useful for the study of optical properties of transition metal alloys. For Fe-Ni alloy with high Ni concentration (Fe 28Ni 72), ε 1, and ε 2 have strong similarities with those of Fe. This indicates that the presence of Fe in the Fe-Ni alloy thin films has a strong effect.

Original languageEnglish
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume206
Pages (from-to)6-11
ISSN0368-2048
DOIs
Publication statusPublished - 1. Jan 2016

Keywords

  • ELF
  • Electronic properties
  • Fe-Ni
  • Optical properties
  • REELS

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