Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

Masahide Sato, Naoto Tsukamoto, Tsubasa Shiratori, Takeshi Furusawa, Noboru Suzuki, Sven Tougaard

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalSurface and Interface Analysis
Issue number38
Pages (from-to)604-609
ISSN0142-2421
DOIs
Publication statusPublished - 2006

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