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Proliferation of Faulty Materials Data Analysis in the Literature

  • Matthew R. Linford
  • , Vincent S. Smentkowski*
  • , John T. Grant
  • , C. Richard Brundle
  • , Peter M.A. Sherwood
  • , Mark C. Biesinger
  • , Jeff Terry
  • , Kateryna Artyushkova
  • , Alberto Herrera-Gómez
  • , Sven Tougaard
  • , William Skinner
  • , Jean Jacques Pireaux
  • , Christopher F. McConville
  • , Christopher D. Easton
  • , Thomas R. Gengenbach
  • , George H. Major
  • , Paul Dietrich
  • , Andreas Thissen
  • , Mark Engelhard
  • , Cedric J. Powell
  • Karen J. Gaskell, Donald R. Baer
*Corresponding author for this work
  • Brigham Young University
  • General Electric Research
  • Surface Analysis Consultant
  • C. R. Brundle and Associates
  • University of Washington
  • University of Western Ontario
  • Illinois Institute of Technology
  • Physical Electronics, Inc., Minnesota
  • CINVESTAV - Unidad Queretaro
  • University of South Australia
  • University of Namur
  • RMIT University
  • SPECS Surface Nano Analysis GmbH
  • Pacific Northwest National Laboratory
  • National Institute of Standards and Technology
  • University of Maryland
  • CSIRO Commonwealth Scientific and Industrial Research Organisation

Research output: Contribution to journalComment/debateResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume26
Issue number1
Pages (from-to)1-2
Number of pages2
ISSN1431-9276
DOIs
Publication statusPublished - Feb 2020

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