| Original language | English |
|---|---|
| Title of host publication | IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015 |
| Number of pages | 7 |
| Publisher | IEEE Computer Society Press |
| Publication date | 2015 |
| Pages | 40-46 |
| DOIs | |
| Publication status | Published - 2015 |
| Externally published | Yes |
Cite this
Schubert, E., Weiler, M., & Zimek, A. (2015). Outlier Detection and Trend Detection: Two Sides of the Same Coin. In IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015 (pp. 40-46). IEEE Computer Society Press. https://doi.org/10.1109/ICDMW.2015.79
@inbook{60489a0fd05f4416baf3da711e870fb4,
title = "Outlier Detection and Trend Detection: Two Sides of the Same Coin",
author = "Erich Schubert and Michael Weiler and Arthur Zimek",
year = "2015",
doi = "10.1109/ICDMW.2015.79",
language = "English",
pages = "40--46",
booktitle = "IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015",
publisher = "IEEE Computer Society Press",
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}
Schubert, E, Weiler, M & Zimek, A 2015, Outlier Detection and Trend Detection: Two Sides of the Same Coin. in IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, pp. 40-46. https://doi.org/10.1109/ICDMW.2015.79
Outlier Detection and Trend Detection: Two Sides of the Same Coin. / Schubert, Erich; Weiler, Michael; Zimek, Arthur.
IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, 2015. p. 40-46.Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review
TY - CHAP
T1 - Outlier Detection and Trend Detection: Two Sides of the Same Coin
AU - Schubert, Erich
AU - Weiler, Michael
AU - Zimek, Arthur
PY - 2015
Y1 - 2015
U2 - 10.1109/ICDMW.2015.79
DO - 10.1109/ICDMW.2015.79
M3 - Book chapter
SP - 40
EP - 46
BT - IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015
PB - IEEE Computer Society Press
ER -
Schubert E, Weiler M, Zimek A. Outlier Detection and Trend Detection: Two Sides of the Same Coin. In IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press. 2015. p. 40-46 https://doi.org/10.1109/ICDMW.2015.79