Outlier Detection and Trend Detection: Two Sides of the Same Coin

Erich Schubert; Michael Weiler; Arthur Zimek

doi:10.1109/ICDMW.2015.79

Outlier Detection and Trend Detection: Two Sides of the Same Coin

Erich Schubert, Michael Weiler, Arthur Zimek

University of Alberta

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

Original language	English
Title of host publication	IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015
Number of pages	7
Publisher	IEEE Computer Society Press
Publication date	2015
Pages	40-46
DOIs	https://doi.org/10.1109/ICDMW.2015.79
Publication status	Published - 2015
Externally published	Yes

Documents & Links

10.1109/ICDMW.2015.79

http://dx.doi.org/10.1109/ICDMW.2015.79

Cite this

@inbook{60489a0fd05f4416baf3da711e870fb4,

title = "Outlier Detection and Trend Detection: Two Sides of the Same Coin",

author = "Erich Schubert and Michael Weiler and Arthur Zimek",

year = "2015",

doi = "10.1109/ICDMW.2015.79",

language = "English",

pages = "40--46",

booktitle = "IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015",

publisher = "IEEE Computer Society Press",

address = "United States",

}

Outlier Detection and Trend Detection: Two Sides of the Same Coin. / Schubert, Erich; Weiler, Michael; Zimek, Arthur.

IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, 2015. p. 40-46.

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Research › peer-review

TY - CHAP

T1 - Outlier Detection and Trend Detection: Two Sides of the Same Coin

AU - Schubert, Erich

AU - Weiler, Michael

AU - Zimek, Arthur

PY - 2015

Y1 - 2015

U2 - 10.1109/ICDMW.2015.79

DO - 10.1109/ICDMW.2015.79

M3 - Book chapter

SP - 40

EP - 46

BT - IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015

PB - IEEE Computer Society Press

ER -