Outlier Detection and Trend Detection: Two Sides of the Same Coin

Erich Schubert, Michael Weiler, Arthur Zimek

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

Original languageEnglish
Title of host publicationIEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015
Number of pages7
PublisherIEEE Computer Society Press
Publication date2015
Pages40-46
DOIs
Publication statusPublished - 2015
Externally publishedYes

Cite this

Schubert, E., Weiler, M., & Zimek, A. (2015). Outlier Detection and Trend Detection: Two Sides of the Same Coin. In IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015 (pp. 40-46). IEEE Computer Society Press. https://doi.org/10.1109/ICDMW.2015.79
Schubert, Erich ; Weiler, Michael ; Zimek, Arthur. / Outlier Detection and Trend Detection: Two Sides of the Same Coin. IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, 2015. pp. 40-46
@inbook{60489a0fd05f4416baf3da711e870fb4,
title = "Outlier Detection and Trend Detection: Two Sides of the Same Coin",
author = "Erich Schubert and Michael Weiler and Arthur Zimek",
year = "2015",
doi = "10.1109/ICDMW.2015.79",
language = "English",
pages = "40--46",
booktitle = "IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015",
publisher = "IEEE Computer Society Press",
address = "United States",

}

Schubert, E, Weiler, M & Zimek, A 2015, Outlier Detection and Trend Detection: Two Sides of the Same Coin. in IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, pp. 40-46. https://doi.org/10.1109/ICDMW.2015.79

Outlier Detection and Trend Detection: Two Sides of the Same Coin. / Schubert, Erich; Weiler, Michael; Zimek, Arthur.

IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press, 2015. p. 40-46.

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

TY - CHAP

T1 - Outlier Detection and Trend Detection: Two Sides of the Same Coin

AU - Schubert, Erich

AU - Weiler, Michael

AU - Zimek, Arthur

PY - 2015

Y1 - 2015

U2 - 10.1109/ICDMW.2015.79

DO - 10.1109/ICDMW.2015.79

M3 - Book chapter

SP - 40

EP - 46

BT - IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015

PB - IEEE Computer Society Press

ER -

Schubert E, Weiler M, Zimek A. Outlier Detection and Trend Detection: Two Sides of the Same Coin. In IEEE International Conference on Data Mining Workshop, ICDMW 2015, Atlantic City, NJ, USA, November 14-17, 2015. IEEE Computer Society Press. 2015. p. 40-46 https://doi.org/10.1109/ICDMW.2015.79