Near-field characterization of ultra-thin metal films

D. I. Yakubovsky*, A. V. Arsenin, R. V. Kirtaev, G. A. Ermolaev, Y. S. Stebunov, V. S. Volkov

*Corresponding author for this work

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Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

Original languageEnglish
Article number012193
Book seriesJournal of Physics: Conference Series
Issue number1
Number of pages4
Publication statusPublished - 23. Apr 2020
Event4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Russian Federation
Duration: 15. Jul 201919. Jul 2019


Conference4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
Country/TerritoryRussian Federation
CitySt. Petersburg
SponsorBruker, INSCIENCE


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