Near-field characterization of ultra-thin metal films

D. I. Yakubovsky; A. V. Arsenin; R. V. Kirtaev; G. A. Ermolaev; Y. S. Stebunov; V. S. Volkov

doi:10.1088/1742-6596/1461/1/012193

Near-field characterization of ultra-thin metal films

D. I. Yakubovsky^*, A. V. Arsenin, R. V. Kirtaev, G. A. Ermolaev, Y. S. Stebunov, V. S. Volkov

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › Research › peer-review

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Abstract

Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS₂ films as well as on a pure Si/SiO₂ substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

Original language	English
Article number	012193
Book series	Journal of Physics: Conference Series
Volume	1461
Issue number	1
Number of pages	4
ISSN	1742-6588
DOIs	https://doi.org/10.1088/1742-6596/1461/1/012193
Publication status	Published - 23. Apr 2020
Event	4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Russian Federation Duration: 15. Jul 2019 → 19. Jul 2019

Conference

Conference	4th International Conference on Metamaterials and Nanophotonics, METANANO 2019
Country/Territory	Russian Federation
City	St. Petersburg
Period	15/07/2019 → 19/07/2019
Sponsor	Bruker, INSCIENCE

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10.1088/1742-6596/1461/1/012193Licence: CC BY

Open Access VersionFinal published version, 954 KBLicence: CC BY

Cite this

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title = "Near-field characterization of ultra-thin metal films",

abstract = "Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.",

author = "Yakubovsky, {D. I.} and Arsenin, {A. V.} and Kirtaev, {R. V.} and Ermolaev, {G. A.} and Stebunov, {Y. S.} and Volkov, {V. S.}",

year = "2020",

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doi = "10.1088/1742-6596/1461/1/012193",

language = "English",

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T1 - Near-field characterization of ultra-thin metal films

AU - Yakubovsky, D. I.

AU - Arsenin, A. V.

AU - Kirtaev, R. V.

AU - Ermolaev, G. A.

AU - Stebunov, Y. S.

AU - Volkov, V. S.

PY - 2020/4/23

Y1 - 2020/4/23

N2 - Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

AB - Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.

U2 - 10.1088/1742-6596/1461/1/012193

DO - 10.1088/1742-6596/1461/1/012193

M3 - Conference article

AN - SCOPUS:85084135714

SN - 1742-6596

VL - 1461

JO - Journal of Physics: Conference Series (Online)

JF - Journal of Physics: Conference Series (Online)

IS - 1

M1 - 012193

T2 - 4th International Conference on Metamaterials and Nanophotonics, METANANO 2019

Y2 - 15 July 2019 through 19 July 2019

ER -

Near-field characterization of ultra-thin metal films

Abstract

Conference

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