Ultra-thin metal films will form the basis of next-generation optoelectronics. However, characterization of their performance requires consideration of nanocrystalline structure and analysis of local optical and electrical properties. In present study, we use scanning near-field optical microscopy (SNOM) for nanoscale probing of optical conductivity of ultrathin metal films. We obtained surface maps of scattered near-field signal for gold films grown on monolayer graphene and MoS2 films as well as on a pure Si/SiO2 substrate. These results clearly demonstrate the difference in generated optical responses and can be used in the development of various devices utilizing ultrathin metal films.
|Book series||Journal of Physics: Conference Series|
|Number of pages||4|
|Publication status||Published - 23. Apr 2020|
|Event||4th International Conference on Metamaterials and Nanophotonics, METANANO 2019 - St. Petersburg, Russian Federation|
Duration: 15. Jul 2019 → 19. Jul 2019
|Conference||4th International Conference on Metamaterials and Nanophotonics, METANANO 2019|
|Period||15/07/2019 → 19/07/2019|