Morphology and effective dielectric functions of ultra-thin gold films

Dmitry I.  Yakubovsky; Roman V.  Kirtaev; Yu V. Stebunov; Aleksey V.  Arsenin; Valentyn S. Volkov

doi:10.1088/1742-6596/1092/1/012167

Morphology and effective dielectric functions of ultra-thin gold films

Dmitry I. Yakubovsky
, Roman V. Kirtaev
, Yu V. Stebunov
, Aleksey V. Arsenin
, Valentyn S. Volkov

Moscow Institute of Physics and Technology
Skolkovo Innovation Center

Research output: Contribution to journal › Conference article › Research › peer-review

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Abstract

In the present study, a new method for analyzing the dielectric functions in dependence with the thickness of ultra-thin gold films is proposed. The reliability of the method is carefully verified through the correlation of optical properties and structural morphology of gold films at thicknesses around the percolation threshold (from 2 to 20 nm). The optical characterization of deposited films is performed in visible and NIR regions (300-1500 nm) by a spectroscopic ellipsometry along with transmission spectra measurements at normal incidence. Fitting of the ellipsometric data allows one to calculate the effective complex dielectric function of cluster-like and continuous films of different mass-equivalent thickness. Surface morphology of the films is analysed by scanning electron microscopy.

Original language	English
Article number	012167
Conference journal	Journal of Physics: Conference Series
Volume	1092
Number of pages	5
ISSN	1742-6588
DOIs	https://doi.org/10.1088/1742-6596/1092/1/012167
Publication status	Published - 9. Sept 2018
Event	3rd International Conference on Metamaterials and Nanophotonics, METANANO 2018 - Sochi, Russian Federation Duration: 17. Sept 2018 → 21. Sept 2018

Conference

Conference	3rd International Conference on Metamaterials and Nanophotonics, METANANO 2018
Country/Territory	Russian Federation
City	Sochi
Period	17/09/2018 → 21/09/2018

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title = "Morphology and effective dielectric functions of ultra-thin gold films",

abstract = "In the present study, a new method for analyzing the dielectric functions in dependence with the thickness of ultra-thin gold films is proposed. The reliability of the method is carefully verified through the correlation of optical properties and structural morphology of gold films at thicknesses around the percolation threshold (from 2 to 20 nm). The optical characterization of deposited films is performed in visible and NIR regions (300-1500 nm) by a spectroscopic ellipsometry along with transmission spectra measurements at normal incidence. Fitting of the ellipsometric data allows one to calculate the effective complex dielectric function of cluster-like and continuous films of different mass-equivalent thickness. Surface morphology of the films is analysed by scanning electron microscopy.",

author = "Yakubovsky, \{Dmitry I.\} and Kirtaev, \{Roman V.\} and Stebunov, \{Yu V.\} and Arsenin, \{Aleksey V.\} and Volkov, \{Valentyn S.\}",

year = "2018",

month = sep,

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doi = "10.1088/1742-6596/1092/1/012167",

language = "English",

volume = "1092",

journal = "Journal of Physics: Conference Series",

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T1 - Morphology and effective dielectric functions of ultra-thin gold films

AU - Yakubovsky, Dmitry I.

AU - Kirtaev, Roman V.

AU - Stebunov, Yu V.

AU - Arsenin, Aleksey V.

AU - Volkov, Valentyn S.

PY - 2018/9/9

Y1 - 2018/9/9

N2 - In the present study, a new method for analyzing the dielectric functions in dependence with the thickness of ultra-thin gold films is proposed. The reliability of the method is carefully verified through the correlation of optical properties and structural morphology of gold films at thicknesses around the percolation threshold (from 2 to 20 nm). The optical characterization of deposited films is performed in visible and NIR regions (300-1500 nm) by a spectroscopic ellipsometry along with transmission spectra measurements at normal incidence. Fitting of the ellipsometric data allows one to calculate the effective complex dielectric function of cluster-like and continuous films of different mass-equivalent thickness. Surface morphology of the films is analysed by scanning electron microscopy.

AB - In the present study, a new method for analyzing the dielectric functions in dependence with the thickness of ultra-thin gold films is proposed. The reliability of the method is carefully verified through the correlation of optical properties and structural morphology of gold films at thicknesses around the percolation threshold (from 2 to 20 nm). The optical characterization of deposited films is performed in visible and NIR regions (300-1500 nm) by a spectroscopic ellipsometry along with transmission spectra measurements at normal incidence. Fitting of the ellipsometric data allows one to calculate the effective complex dielectric function of cluster-like and continuous films of different mass-equivalent thickness. Surface morphology of the films is analysed by scanning electron microscopy.

U2 - 10.1088/1742-6596/1092/1/012167

DO - 10.1088/1742-6596/1092/1/012167

M3 - Conference article

SN - 1742-6588

VL - 1092

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

M1 - 012167

T2 - 3rd International Conference on Metamaterials and Nanophotonics, METANANO 2018

Y2 - 17 September 2018 through 21 September 2018

ER -

Morphology and effective dielectric functions of ultra-thin gold films

Abstract

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