Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eV

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalSurface and Interface Analysis
Volume42
Pages (from-to)1100-1104
ISSN0142-2421
DOIs
Publication statusPublished - 2010

Cite this