Loss analysis of NPC and T-Type three-level converter for Si, SiC, and GaN based devices

Khushboo Kumari, Swagata Mapa, Ramkrishan Maheshwari

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Multilevel converters are widely used for its significant benefit of low harmonics and reduced switching losses compared to two-level converter. This paper presents a comparative evaluation of loss of two three-level inverter topologies, namely Neutral Point Clamped Converter (NPC) and T-type converter. The loss analysis are done for both topologies based on different devices like Silicon (Si), Silicon Carbide (SiC) and Gallium Nitride (GaN). Loss breakdown analysis for each switches and diodes in both topology are presented for different switching frequency and loading condition. Evaluation is mainly done with the help of MATLAB, and LTSpice. Comparison of losses for different switching frequency for different switches are done for both topologies. The result of loss estimation obtained from simulation and m-file is approximately the same. The result shows that GaN and SiC based converter is more efficient than Si based NPC and T-Type converter.

Original languageEnglish
Title of host publicationPIICON 2020 - 9th IEEE Power India International Conference
PublisherIEEE
Publication dateFeb 2020
Article number9112873
ISBN (Electronic)9781728166643
DOIs
Publication statusPublished - Feb 2020
Externally publishedYes
Event9th IEEE Power India International Conference, PIICON 2020 - SonePat, India
Duration: 28. Feb 20201. Mar 2020

Conference

Conference9th IEEE Power India International Conference, PIICON 2020
Country/TerritoryIndia
CitySonePat
Period28/02/202001/03/2020
SponsorIEEE Delhi Section, IEEE Industry Applications Society, IEEE PELS-IES Delhi Chapter, IEEE PES-IAS Delhi Chapter, IEEE Power and Energy Society (PES), NTPC (A Govt. of India Enterprises)

Keywords

  • GaN
  • Multilevel converter
  • NPC
  • Si
  • SiC
  • T-type

Fingerprint

Dive into the research topics of 'Loss analysis of NPC and T-Type three-level converter for Si, SiC, and GaN based devices'. Together they form a unique fingerprint.

Cite this