HEIST: A Hardware Signal Fault Injection Methodology Enabling Feasible Software Robustness Testing

Martin Skriver*, Anders Stengaard, Ulrik Pagh Schultz

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

In this paper we investigate the use of FPGAs to inject faults into data streams as a supplement to the international EMC-test standards. We aim to test the robustness and reliability of software based measures against the effects of electromagnetic interference. The proposed methodology, HEIST, uses high-speed acquisition of faulty data and high-speed fault injection. HEIST requires less insight into electromagnetism and electronics compared to other iterative EMC qualification processes. This is particularly relevant in designs where a strategy of 100% hardware-based noise avoidance is not feasible, and software based noise handling has been implemented as a supplement. Such situations are typical in mobile light-weight systems such as drones, where shielding and hardware filters add undesirable weight. The methodology is verified by comparing data from a serial communication link that has been exposed to burst noise based on the IEC 61000-4-4 test standard with data from the same setup, but replacing the burst generator with the HEIST approach. The result shows an excellent correlation indicating that HEIST can replace the burst generator for a software EMC test in an ongoing software development process.

Original languageEnglish
Title of host publication2021 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
EditorsMuhammad Shafique, Andreas Steininger, Lukas Sekanina, Milos Krstic, Goran Stojanovic, Vojtech Mrazek
PublisherIEEE
Publication date2021
Pages123-126
ISBN (Electronic)9781665435956
DOIs
Publication statusPublished - 2021
Event24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 - Vienna, Austria
Duration: 7. Apr 20219. Apr 2021

Conference

Conference24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021
Country/TerritoryAustria
CityVienna
Period07/04/202109/04/2021
SponsorTU Wien

Keywords

  • fault injection
  • FPGA
  • software robustness test

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