Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

Alwin Klick, Malte Großmann, Maria Beewen, Paul Bittorf, Jacek Fiutowski, Till Leißner, Horst-Günter Rubahn, Carsten Reinhardt, Hans-Joachim Elmers, Michael Bauer

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Abstract

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.
Original languageEnglish
Article number053704
JournalReview of Scientific Instruments
Volume90
Issue number5
Number of pages7
ISSN0034-6748
DOIs
Publication statusPublished - 16. May 2019

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