Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

Alwin Klick, Malte Großmann, Maria Beewen, Paul Bittorf, Jacek Fiutowski, Till Leißner, Horst-Günter Rubahn, Carsten Reinhardt, Hans-Joachim Elmers, Michael Bauer

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.
Original languageEnglish
Article number053704
JournalReview of Scientific Instruments
Volume90
Issue number5
Number of pages7
ISSN0034-6748
DOIs
Publication statusPublished - 16. May 2019

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Photoemission
Electron microscopy
electron microscopy
photoelectric emission
Lighting
illumination
Ultrashort pulses
Laser pulses
Photons
incidence
Geometry
pulses
polaritons
illuminating
excitation
lasers
propagation
photons
geometry

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Klick, Alwin ; Großmann, Malte ; Beewen, Maria ; Bittorf, Paul ; Fiutowski, Jacek ; Leißner, Till ; Rubahn, Horst-Günter ; Reinhardt, Carsten ; Elmers, Hans-Joachim ; Bauer, Michael. / Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side. In: Review of Scientific Instruments. 2019 ; Vol. 90, No. 5.
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abstract = "We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.",
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Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side. / Klick, Alwin; Großmann, Malte; Beewen, Maria; Bittorf, Paul; Fiutowski, Jacek; Leißner, Till; Rubahn, Horst-Günter; Reinhardt, Carsten; Elmers, Hans-Joachim; Bauer, Michael.

In: Review of Scientific Instruments, Vol. 90, No. 5, 053704, 16.05.2019.

Research output: Contribution to journalJournal articleResearchpeer-review

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T1 - Femtosecond time-resolved photoemission electron microscopy operated at sample illumination from the rear side

AU - Klick, Alwin

AU - Großmann, Malte

AU - Beewen, Maria

AU - Bittorf, Paul

AU - Fiutowski, Jacek

AU - Leißner, Till

AU - Rubahn, Horst-Günter

AU - Reinhardt, Carsten

AU - Elmers, Hans-Joachim

AU - Bauer, Michael

PY - 2019/5/16

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N2 - We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.

AB - We present an advanced experimental setup for time-resolved photoemission electron microscopy (PEEM) with sub-20 fs resolution, which allows for normal incidence and highly local sample excitation with ultrashort laser pulses. The scheme makes use of a sample rear side illumination geometry that enables us to confine the sample illumination spot to a diameter as small as 6 μm. We demonstrate an operation mode in which the spatiotemporal dynamics following a highly local excitation of the sample is globally probed with a laser pulse illuminating the sample from the front side. Furthermore, we show that the scheme can also be operated in a time-resolved normal incidence two-photon PEEM mode with interferometric resolution, a technique providing a direct and intuitive real time view onto the propagation of surface plasmon polaritons.

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