Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003

G.T. Orosz, G. Gergely, S. Gurban, M. Menyhard, J. Toth, D. Varga, S. Tougaard

    Research output: Contribution to journalJournal articleResearch

    Original languageEnglish
    JournalZhenkong
    Volume71
    Pages (from-to)147-152
    ISSN1002-0322
    Publication statusPublished - 2003

    Cite this

    Orosz, G. T., Gergely, G., Gurban, S., Menyhard, M., Toth, J., Varga, D., & Tougaard, S. (2003). Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003. Zhenkong, 71, 147-152.