Exciton-polaron quenching in organic thin-film transistors studied by fluorescence lifetime imaging microscopy

Per Baunegaard With Jensen, Till Leißner, Andreas Osadnik, Arne Lützen, Jonathan R. Brewer, Jakob Kjelstrup-Hansen

Research output: Contribution to conference without publisher/journalPosterResearch

Abstract

Organic semiconductors show great potential in electronic and optical applications. However, a major challenge is the degradation of the semiconductor materials that cause a reduction in device performance. Here, we present our investigations of Organic Thin Film Transistors (OTFT) based on the material 5,5-bis(naphthyl)-2,20-bithiophene (NaT2). These types of OTFT have previously been shown to have light emitting properties. Fluorescence Lifetime Imaging Microscopy (FLIM) has been used to investigate the exciton-polaron quenching in biased OTFTs. A clear reduction in fluorescence lifetime that correlates with the local charge density indicates a pronounced exciton quenching by the injected charges. Subsequent FLIM measurements on previously biased OTFT devices show a general decrease in fluorescence lifetime suggesting degradation of the organic semiconductor. This is correlated with the results from electrical transport measurements that yielded the hole mobility and threshold voltage.
Original languageEnglish
Publication date29. Sep 2015
Publication statusPublished - 29. Sep 2015
EventXIV Brazil Materials Research Society Meeting - Rio de Janeiro, Brazil
Duration: 27. Sep 20151. Oct 2015

Conference

ConferenceXIV Brazil Materials Research Society Meeting
CountryBrazil
CityRio de Janeiro
Period27/09/201501/10/2015

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