Enhancing DC-DC Boost Converter Performance with Vertical GaN Split-RSO-MOSFET

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

This work focuses to improve the performance of DC-DC converters utilizing a vertical GaN split-gate technology-based resurf stepped oxide MOSFET (Split-RSO-MOSFET). The field-plate (FP) electrode in the Split-RSO-MOSFET helps to reduce the surface electric field and binges in the middle of the drift layer, while being enveloped by a thicker oxide within the trench. The Split-RSO-MOSFET was simulated and analyzed using the TCAD simulator and compared with the conventional Trench-MOSFET and RSO-MOSFET. Compared to the Trench-MOSFET and RSO-MOSFET, the Split-RSO-MOSFET exhibits a significant ~11-fold decrease in CGD and a ~42% reduction in energy loss during conversion, attributed to the inclusion of an inter-dielectric layer and gate insulation from the drain by FP. A Split-RSO-MOSFET, functioning with low energy loss, will consequently result in reduced converter dimensions and enhanced system efficiency.

Original languageEnglish
Title of host publicationInternational Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025
PublisherVDE-Verlag
Publication date2025
Pages1626-1631
ISBN (Electronic)9783800765416
DOIs
Publication statusPublished - 2025
Event2025 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025 - Nuremberg, Germany
Duration: 6. May 20258. May 2025

Conference

Conference2025 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Europe 2025
Country/TerritoryGermany
CityNuremberg
Period06/05/202508/05/2025
SeriesPCIM Europe Conference Proceedings
ISSN2191-3358

Fingerprint

Dive into the research topics of 'Enhancing DC-DC Boost Converter Performance with Vertical GaN Split-RSO-MOSFET'. Together they form a unique fingerprint.

Cite this