Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

Udgivelsesdato: 2010
Original languageEnglish
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume178
Pages (from-to)128-153
Number of pages26
ISSN0368-2048
DOIs
Publication statusPublished - 1. Jan 2010

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