Electronic Properties of Semiconductor Nanowires

Morten Willatzen, Lok C. Lew Yan Voon, Benny Lassen, Yong Zhang, Qihua Xiong, Peter C. Eklund

Research output: Contribution to journalReviewResearch

Original languageEnglish
JournalJournal of Nanoscience and Nanotechnology
Volume8
Issue number1
Pages (from-to)1-26
ISSN1533-4880
Publication statusPublished - 2008

Cite this

Willatzen, M., C. Lew Yan Voon, L., Lassen, B., Zhang, Y., Xiong, Q., & C. Eklund, P. (2008). Electronic Properties of Semiconductor Nanowires. Journal of Nanoscience and Nanotechnology, 8(1), 1-26.
Willatzen, Morten ; C. Lew Yan Voon, Lok ; Lassen, Benny ; Zhang, Yong ; Xiong, Qihua ; C. Eklund, Peter. / Electronic Properties of Semiconductor Nanowires. In: Journal of Nanoscience and Nanotechnology. 2008 ; Vol. 8, No. 1. pp. 1-26.
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year = "2008",
language = "English",
volume = "8",
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journal = "Journal of Nanoscience and Nanotechnology",
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Willatzen, M, C. Lew Yan Voon, L, Lassen, B, Zhang, Y, Xiong, Q & C. Eklund, P 2008, 'Electronic Properties of Semiconductor Nanowires', Journal of Nanoscience and Nanotechnology, vol. 8, no. 1, pp. 1-26.

Electronic Properties of Semiconductor Nanowires. / Willatzen, Morten; C. Lew Yan Voon, Lok; Lassen, Benny; Zhang, Yong; Xiong, Qihua; C. Eklund, Peter.

In: Journal of Nanoscience and Nanotechnology, Vol. 8, No. 1, 2008, p. 1-26.

Research output: Contribution to journalReviewResearch

TY - JOUR

T1 - Electronic Properties of Semiconductor Nanowires

AU - Willatzen, Morten

AU - C. Lew Yan Voon, Lok

AU - Lassen, Benny

AU - Zhang, Yong

AU - Xiong, Qihua

AU - C. Eklund, Peter

PY - 2008

Y1 - 2008

M3 - Review

VL - 8

SP - 1

EP - 26

JO - Journal of Nanoscience and Nanotechnology

JF - Journal of Nanoscience and Nanotechnology

SN - 1533-4880

IS - 1

ER -

Willatzen M, C. Lew Yan Voon L, Lassen B, Zhang Y, Xiong Q, C. Eklund P. Electronic Properties of Semiconductor Nanowires. Journal of Nanoscience and Nanotechnology. 2008;8(1):1-26.