Electromechanical Phenomena in semiconductor nanostructures

Lok C. Lew Yan Voon, Morten Willatzen

Research output: Contribution to journalReviewResearch

Original languageEnglish
JournalJournal of Applied Physics
Volume109
Pages (from-to)031101
Number of pages24
ISSN0021-8979
Publication statusPublished - 2011

Cite this

@article{7c4d4439903f47a38a2691cd7902a9ce,
title = "Electromechanical Phenomena in semiconductor nanostructures",
author = "{Lew Yan Voon}, {Lok C.} and Morten Willatzen",
year = "2011",
language = "English",
volume = "109",
pages = "031101",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",

}

Electromechanical Phenomena in semiconductor nanostructures. / Lew Yan Voon, Lok C.; Willatzen, Morten.

In: Journal of Applied Physics, Vol. 109, 2011, p. 031101.

Research output: Contribution to journalReviewResearch

TY - JOUR

T1 - Electromechanical Phenomena in semiconductor nanostructures

AU - Lew Yan Voon, Lok C.

AU - Willatzen, Morten

PY - 2011

Y1 - 2011

M3 - Review

VL - 109

SP - 031101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -