Determining the Dielectric Tensor of Micro-Textured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

Sebastian Funke, Matthias Duwe, Frank Balzer, Peter H. Thiesen, Kurt Hingerl, Manuela Schiek

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Abstract

Polycrystalline textured thin films with distinct pleochroism and birefringence comprising oriented rotational domains of the orthorhombic polymorph of an anilino squaraine with isobutyl side chains (SQIB) are analyzed by imaging Mueller matrix ellipsometry to obtain the biaxial dielectric tensor. Simultaneous fitting of transmission and oblique incidence reflection Mueller matrix scans combined with the spatial resolution of an optical microscope allows to accurately determine the full biaxial dielectric tensor from a single crystallographic sample orientation. Oscillator dispersion relations model well the dielectric tensor components. Strong intermolecular interactions cause the real permittivity for all three directions to become strongly negative near the excitonic resonances, which is appealing for nanophotonic applications.
Original languageEnglish
JournalThe Journal of Physical Chemistry Letters
Volume12
Issue number12
Pages (from-to)3053-3058
ISSN1948-7185
DOIs
Publication statusPublished - 19. Mar 2021

Keywords

  • imaging Mueller matrix ellipsometry
  • Davydov splitting
  • squaraine
  • biaxial dielectric tensor

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