Determination of Biaxial Dielectric Tensor from Textured, Pleochroic Organic Thin Films by Imaging Mueller Matrix Ellipsometry

Manuela Schiek, Frank Balzer, Sebastian Funke, Matthias Duwe, Kurt Hingerl, Peter H. Thiesen

Research output: Contribution to conference without publisher/journalConference abstract for conferenceResearch

Original languageEnglish
Publication date26. Feb 2020
Publication statusAccepted/In press - 26. Feb 2020
EventEMRS 2020 Spring Meeting - Congress & Exhibition Centre, Strasbourg, France
Duration: 25. May 202029. May 2020
https://www.european-mrs.com/meetings/2020-spring-meeting

Conference

ConferenceEMRS 2020 Spring Meeting
LocationCongress & Exhibition Centre
CountryFrance
CityStrasbourg
Period25/05/202029/05/2020
Internet address

Cite this

Schiek, M., Balzer, F., Funke, S., Duwe, M., Hingerl, K., & Thiesen, P. H. (Accepted/In press). Determination of Biaxial Dielectric Tensor from Textured, Pleochroic Organic Thin Films by Imaging Mueller Matrix Ellipsometry. Abstract from EMRS 2020 Spring Meeting, Strasbourg, France.