Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification

A.I. Martin-Concepción, F. Yubero, J.P. Espinos, J. Garcia, S. Tougaard

    Research output: Contribution to journalJournal articleResearch

    Original languageEnglish
    JournalSurface and Interface Analysis
    Volume35
    Pages (from-to)984-90
    ISSN0142-2421
    Publication statusPublished - 2003

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