Sven Mosbæk Tougaard

PhD, dr.scient.

  • Campusvej 55

    5230 Odense M

    Denmark

1976 …2020

Research output per year

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Research Output

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Journal article

First nucleation steps of nickel nanoparticle growth on Al2O3 (0001) studied by XPS inelastic peak shape analysis

Tougaard, S. M., 1. Dec 2008, In : Applied Surface Science. 255, 5, p. 3000-3003 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Ge growth on Si(001) studied by x-ray photoelectron spectroscopy peakshape analysis and atomic force microscopy

Schleberger, M., Simonsen, A. C., Tougaard, S., Lundsgaard Hansen, J. & Nylandsted Larsen, A., 1. Nov 1997, In : Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films. 15, 6, p. 3032-3035 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Growth mechanism of iron nanoparticles on (0001) sapphire wafers

Tougaard, S. M., 1. Nov 2008, In : Microelectronics Journal. 39, 11, p. 1374-1375 2 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Impact of curing time on ageing and degradation of phenol-urea-formaldehyde binder

Okhrimenko, D. V., Thomsen, A. B., Ceccato, M., Johansson, D. B., Lybye, D., Bechgaard, K., Tougaard, S. & Stipp, S. L. S., 2018, In : Polymer Degradation and Stability. 152, p. 86-94

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
10 Downloads (Pure)

Improved XPS analysis by visual inspection of the survey spectrum

Tougaard, S. M., 2018, In : Surface and Interface Analysis. 50, 6, p. 657-666

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission

Tougaard, S. M., 2014, In : Surface and Interface Analysis. 46, p. 906-910 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
320 Downloads (Pure)

Inelastic Scattering Cross Section of Si Determined from Angular Dependent Reflection Electron Energy Loss Spetra

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 321-324 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Intercomparison of Methods for Separation of REELS Elastic Peak Intensities for Determination of IMFP

Tougaard, S., Krawczyk, M., Jablonski, A., Pavluch, J., Tóth, J., Varga, D., Gergely, G., Menyhárd, M. & Sulyok, A., 2001, In : Surface and Interface Analysis. 31, p. 1-10

Research output: Contribution to journalJournal articleResearch

Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge

Kövér, L., Novák, M., Egri, S., Cserny, I., Berényi, Z., Tóth, J., Varga, D., Drube, W., Yubero, F., Tougaard, S. & Werner, W. S. M., 2006, In : Surface and Interface Analysis. 38, p. 569-573

Research output: Contribution to journalJournal articleResearchpeer-review

LMM Auger primary excitation spectra of copper

Tougaard, S. M., 2014, In : Surface Science. 630, p. 294-299 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
420 Downloads (Pure)

Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method

Tougaard, S. M., Jin, H., Shinotsuka, H., Yoshikawa, H., Iwai, H. & Tanuma, S., 2010, In : Journal of Applied Physics. 107, p. 083709-1 083709-11 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Mechanisms for oxygen adsorption on the Si(110) surface studied by Auger electron spectroscopy

Tougaard, S., Morgen, P. & Onsgaard, J., 2. Nov 1981, In : Surface Science. 111, 3, p. 545-554 10 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eV

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1100-1104

Research output: Contribution to journalJournal articleResearchpeer-review

Modeling of X-ray photoelectron spectra-surface and core hole effects

Tougaard, S. M., 2014, In : Surface and Interface Analysis. 46, 10-11, p. 920-923 4 p., DOI 10.1002/sia.5372.

Research output: Contribution to journalJournal articleResearchpeer-review

Morphology of Ferromagnetic Cobalt Nanoparticles Grown on Al2O3 (0001) by Pulsed Laser Deposition

Tougaard, S. M., 2014, In : Journal of Advanced Microscopy Research. 8, p. 1-6, p. 1-6 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Nanostructure of Ge deposited on Si(001): a study by XPS peak shape analysis and AFM

Simonsen, A. C., Schleberger, M., Tougaard, S., Lundsgaard Hansen, J. & Nylandsted Larsen, A., 1999, In : Thin Solid Films. 338, 1-2, p. 165-71 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 15. Sep 2008, In : Surface Science. 602, 18, p. 3064-3070 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Non-Destructive Depth Profiling by XPS Peak Shape Analysis

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 220-224 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Nondestructive quantitative XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 2008, In : Surface and Interface Analysis. 40, p. 688-691 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Novel applications of inelastic background XPS analysis:3D imaging and HAXPES

Tougaard, S. M., 2017, In : Journal of Surface Analysis. 24, 2, p. 107-114

Research output: Contribution to journalJournal articleResearchpeer-review

Observation of changes in the electronic density of states at a Si (111) surface during adsorption of oxygen by Auger electron spectroscopy

Morgen, P., Onsgaard, J. H. & Tougaard, S., 1. Dec 1979, In : Applied Physics Letters. 34, 8, p. 488-490 3 p.

Research output: Contribution to journalJournal articleResearchpeer-review

On the ultrathin gold film used as buffer layer at the transparent conductive anode/organic electron donor interface

Tougaard, S. M., 2011, In : Gold Bulletin. 44, p. 199-205 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access

Optical properties and electronic transitions of zinc oxide, ferric oxide, cerium oxide, and samarium oxide in the ultraviolet and extreme ultraviolet

Pauly, N., Yubero, F., Espinós, J. P. & Tougaard, S., 2017, In : Applied Optics. 56, 23, p. 6611-6621

Research output: Contribution to journalJournal articleResearchpeer-review

Optical properties of molybdenum in the ultraviolet and extreme ultraviolet by reflection electron energy loss spectroscopy

Pauly, N., Yubero, F. & Tougaard, S., 2020, In : Applied Optics. 59, 14, p. 4527-4532 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Oscillating Surface Effect in Reflection-electron energy loss spectra

Pauli, N., Tougaard, S. & Yubero, F., 2006, In : Physical Review B. 73, 3, p. 035402

Research output: Contribution to journalJournal articleResearchpeer-review

Practical Correction Procedures for Elastic Electron Scattering Effects in ARXPS

Lassen, T. S., Tougaard, S. & Jablonski, A., 2001, In : Surf. Sci.. 481, p. 150-62

Research output: Contribution to journalJournal articleResearch

Primary excitation spectra in XPS and AES of Cu, CuO: Relative importance of surface and core hole effects

Pauly, N. & Tougaard, S. M., 2015, In : Surface Science. 641, p. 326-329

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access

Probing deeper by Hard X-ray Photoelectron Spectroscopy

Tougaard, S. M., 2014, In : Applied Physics Letters. 104, 5, 4 p., 051608.

Research output: Contribution to journalJournal articleResearchpeer-review

File
400 Downloads (Pure)

Probing the ex situ morphology of Ge islands on Si(001): AFM and XPS inelastic peak shape analysis

Simonsen, A. C., Tougaard, S., Lundsgaard Hansen, J. & Nylandsted Larsen, A., 2001, In : Surface and Interface Analysis. 31, 4, p. 328-337 10 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Pulsed laser deposition of aluminum-doped ZnO films at 355 nm.

Holmelund, E., Schou, J., Thestrup, B., Tougaard, S., Johnson, E. & Nielsen, M. M., 2004, In : Applied Physics. A79, p. 1137-1139

Research output: Contribution to journalJournal articleResearchpeer-review

Pure and Sn-doped ZnO films produced by pulsed laser deposition

Holmelund, E., Schou, J., Tougaard, S. & Larsen, N. B., 2002, In : Applied Surface Science. p. 197-198; 467-71

Research output: Contribution to journalJournal articleResearch

Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

Sato, M., Tsukamoto, N., Shiratori, T., Furusawa, T., Suzuki, N. & Tougaard, S., 2006, In : Surface and Interface Analysis. 38, p. 604-609

Research output: Contribution to journalJournal articleResearchpeer-review

Quantification of Au deposited on Ni: XPS peak shape analysis compared to RBS

Simonsen, A. C., Pøhler, J. P., Jeynes, C. & Tougaard, S., 1999, In : Surface and Interface Analysis. 27, 1, p. 52-56 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Quantification of plasmon excitations in core-level photoemission

Yubero, F. & Tougaard, S., 2005, In : Physical Review B. 71, p. 045414

Research output: Contribution to journalJournal articleResearchpeer-review

Quantification of Well-characterized Langmuir-Blodgett Film by Analysis of the PeakShape of XPS taken at Different Emission Angles.

Suzuki, N., Kato, T. & Tougaard, S., 2001, In : Surface and Interface Analysis. 31, p. 862-8

Research output: Contribution to journalJournal articleResearch

Quantitative analysis of Ni 2p photoemission in NiO and Ni diluted in a SiO2 matrix

Pauly, N., Yubero, F., García-García, F. J. & Tougaard, S. M., 2016, In : Surface Science. 644, p. 46-52

Research output: Contribution to journalJournal articleResearchpeer-review

60 Downloads (Pure)

Quantitative analysis of reflection electron energy loss spectra for ultra-thin HfO2, Al2O3 and Hf-Al-O dielectric films on Si(100)

Jin, H., Oh, S. K., Kang, H. J. & Tougaard, S., 2006, In : Oyo Buturi. 100, p. 083713

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films

Tahir, D., Oh, S. K., Kang, H. J. & Tougaard, S. M., 2016, In : Journal of Electron Spectroscopy and Related Phenomena. 206, p. 6-11

Research output: Contribution to journalJournal articleResearchpeer-review

51 Downloads (Pure)

Quantitative analysis of satellite structures in XPS spectra of gold and silver

Pauly, N., Yubero, F. & Tougaard, S. M., 2016, In : Applied Surface Science. 383, p. 317-323

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative analysis of Yb 4d photoelectron spectrum of metallic Yb

Pauly, N., Yubero, F. & Tougaard, S. M., 2018, In : Surface and Interface Analysis. 50, 11, p. 1168-1173

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy

Tougaard, S. M., 2018, In : Journal of Applied Physics. 124, 8, 085115.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
92 Downloads (Pure)

Quantitative model of electron energy loss in XPS

Simonsen, A. C., Yubero, F. & Tougaard, S., 15. Jul 1997, In : Physical Review B. 56, 3, p. 1612-1619 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative non‐destructive in‐depth composition information from XPS

Tougaard, S. M., 1986, In : Surface and Interface Analysis. 8, 6, p. 257-260

Research output: Contribution to journalJournal articleResearch

Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range

Renault, O., Zborowski, C., Risterucci, P., Wiemann, C., Grenet, G., Schneider, C. M. & Tougaard, S. M., 2016, In : Applied Physics Letters. 109, 1, 5 p., 011602.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
178 Downloads (Pure)

Quantitative XPS: non-destructive analysis of surface nano-structures

Tougaard, S. M., Jul 1996, In : Applied Surface Science. 100-101, p. 1-10

Research output: Contribution to journalJournal articleResearch

QUEELS Software Package for Calculation of Surface Effects in Electron Spectra.

Tougaard, S. & Yubero, F., 2004, In : Surface and Interface Analysis. 36, p. 824-827

Research output: Contribution to journalJournal articleResearchpeer-review

Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 623-627 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
604 Downloads (Pure)

Sample-morphology effects on x-ray photoelectron peak intensities

Tougaard, S. M., 2013, In : Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films. 31, 2, p. 021402-1 to 021402-7 8 p., 021402.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
350 Downloads (Pure)