Sven Mosbæk Tougaard

PhD, dr.scient.

  • Campusvej 55

    5230 Odense M

    Denmark

1976 …2020

Research output per year

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Research Output

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Journal article
2007

Characterization of Au nano-cluster formation on and diffusion in polystyrene using XPS peak shape analysis

Tougaard, S., 2007, In : Surface Science. 610, p. 3261-3267

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic prperties of ultrathin (HfO2)x (SiO2)1-x dielectrics on Si(100)

Tougaard, S., 2007, In : Oyo Buturi. 102, 5, p. 053709-053709-6 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical Determination of the surface excitation parameter for Ti, Fe, Cu, Pd, Au, and Au

Tougaard, S., 2007, In : Surface Science. 601, 23, p. 5611-5615

Research output: Contribution to journalJournal articleResearchpeer-review

2008

Calculation of the angular distribution of the surface excitation parameter for Ti, Fe, Cu, Pd, Ag, and Au

Tougaard, S., 2008, In : Surface and Interface Analysis. 40, p. 731-733 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Determination of the surface excitation parameter for oxides: TiO2, SiO2, ZrO2 and Al2O3

Tougaard, S., 1. Jun 2008, In : Surface Science. 602, 11, p. 1974-1978 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Erratum: Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms[Phys. Rev. B 77, 155403 (2008)]

Hajati, S., Romanyuk, O., Zemek, J. & Tougaard, S. M., 5. Jun 2008, In : Physical Review B. 77, 249904(E), 3 p.

Research output: Contribution to journalJournal articleResearchpeer-review

First nucleation steps of nickel nanoparticle growth on Al2O3 (0001) studied by XPS inelastic peak shape analysis

Tougaard, S. M., 1. Dec 2008, In : Applied Surface Science. 255, 5, p. 3000-3003 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Growth mechanism of iron nanoparticles on (0001) sapphire wafers

Tougaard, S. M., 1. Nov 2008, In : Microelectronics Journal. 39, 11, p. 1374-1375 2 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 15. Sep 2008, In : Surface Science. 602, 18, p. 3064-3070 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Nondestructive quantitative XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 2008, In : Surface and Interface Analysis. 40, p. 688-691 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Test of validity of the V-type approach for electron trajectories in reflection electron energy loss spectroscopy

Tougaard, S., 1. Jun 2008, In : Physical Review B. 77, 24, p. Article Number: 245405 12 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical determination of the surface excitation parameter for Ti, Fe, Cu, Pd, Ag, and Au

Tougaard, S., 2008, In : Surface Science. 601, p. 5611-5615 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms

Hajati, S., Romanyuk, O., Zemek, J. & Tougaard, S., 1. Jun 2008, In : Physical Review B. 77, 24, p. 155403 15 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2009

Angular and Energy Dependences of Reflection Electron Energy Loss Spectra of Si

Tougaard, S. M., 2009, In : e-Journal of Surface Science and Nanotechnology. 7, p. 199-202 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Determination of the effective surface region thickness and of Begrenzungseffect

Tougaard, S. M., 1. May 2009, In : Surface Science. 603, p. 2158-2162 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Dielectric and optical properties of Zr silicate thin films grown on Si(100) by atomic layer deposition

Tougaard, S. M., 1. Jan 2009, In : Journal of Applied Physics. 106, p. 0841081-0841086 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic Scattering Cross Section of Si Determined from Angular Dependent Reflection Electron Energy Loss Spetra

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 321-324 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Non-Destructive Depth Profiling by XPS Peak Shape Analysis

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 220-224 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Surface excitation parameter for selected polymers

Tougaard, S. M., 1. Jan 2009, In : Surface and Interface Analysis. 41, p. 23-26 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2010

An Application for Near Real-time Analysis of XPS Data

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1061-1065

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and Optical Properties of Al2O3/SiO2 Thin Films grown on Si Substrate

Tahir, D., Lan Kwon, H., Chung Shin, H., Oh, S. K., Kang, H. J., Heo, S., Gwan Chung, J., Cheol Lee, J. & Tougaard, S. M., 2010, In : Journal of Physics D: Applied Physics. 43, p. 255301 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of GIZO thin film grown on SiO2/Si substrates

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 906-910

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and Optical Properties of La-aluminate Thin Films on Si (100)

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1566-1569 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Energy loss function for Si determined from reflection electron energy loss spectrawith factor analysis method

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1076-1081 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

Tougaard, S. M., 1. Jan 2010, In : Journal of Electron Spectroscopy and Related Phenomena. 178, p. 128-153 26 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method

Tougaard, S. M., Jin, H., Shinotsuka, H., Yoshikawa, H., Iwai, H. & Tanuma, S., 2010, In : Journal of Applied Physics. 107, p. 083709-1 083709-11 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eV

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1100-1104

Research output: Contribution to journalJournal articleResearchpeer-review

Surface and core hole effects in X-ray photoelectron spectroscopy

Tougaard, S. M., 2010, In : Surface Science. 604, p. 1193 1196 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Surface excitation parameter for 12 semiconductors and determination of a general predictive formula

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 41, 9, p. 735-740 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

XPS for non-destructive depth profiling and 3D imaging of surface nanostructures

Tougaard, S. M., 1. Jan 2010, In : Analytical and Bioanalytical Chemistry. 396, p. 2741-2755 15 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2011

Controlled adhesion of Salmonella Typhimurium to poly(oligoethylene glycol methacrylate) grafts

Mrabet, B., Mejbri, A., Machouche, S., Gam-Derouich, S., Turmine, M., Mechouet, M., Lang, P., Bakala, H., Bakrouf, A., Tougaard, S. M. & Chehimi, M. M., 2011, In : Surface and Interface Analysis. 43, 11, p. 1436-1443

Research output: Contribution to journalJournal articleResearchpeer-review

Core hole and surface excitation correction parameter for XPS peak intensities

Tougaard, S. M., 2011, In : Surface Science. 605, p. 1556-1562 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Dielectric response functions of the (0001), and (1013) GaN single crystalline and disordered surfaces studied by reflection electron energy loss spectroscopy

Tougaard, S. M., 2011, In : Journal of Applied Physics. 110, p. 043507-01-043507-07 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Experimental verification of the shape of the excitation depth distribution function for AES

Tougaard, S. M. & Jablonski, A., 2011, In : Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films. A29, p. 051401-1 to 051401-10 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

On the ultrathin gold film used as buffer layer at the transparent conductive anode/organic electron donor interface

Tougaard, S. M., 2011, In : Gold Bulletin. 44, p. 199-205 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
2012

Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 1147-1150

Research output: Contribution to journalJournal articleResearchpeer-review

File
221 Downloads (Pure)

Dielectric description of the angular dependence of the loss structure in core level photoemission

Tougaard, S. M., 2012, In : Journal of Electron Spectroscopy and Related Phenomena. 185, p. 552-558

Research output: Contribution to journalJournal articleResearchpeer-review

File
199 Downloads (Pure)

Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy

Tougaard, S. M., 2012, In : Journal of Physics: Condensed Matter. 24, p. 175002 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS

Tougaard, S. M., 2012, In : Journal of Electron Spectroscopy and Related Phenomena. 185, p. 18-22 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of selected polymers studied by reflection electron spectroscopy

Tougaard, S. M., 2012, In : Journal of Applied Physics. 111, p. 054101-1 -054101-7 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 623-627 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
604 Downloads (Pure)

Software package to calculate the effects of the core hole and surface excitations on XPS and AES

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 1114-1118 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
242 Downloads (Pure)
2013
Open Access
File
573 Downloads (Pure)

Factor analysis and advanced inelastic background analysis in XPS: Unraveling time dependent contamination growth on multilayers and thin films

Tougaard, S. M., 2013, In : Surface Science. 616, p. 161-165 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
382 Downloads (Pure)

Sample-morphology effects on x-ray photoelectron peak intensities

Tougaard, S. M., 2013, In : Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films. 31, 2, p. 021402-1 to 021402-7 8 p., 021402.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
350 Downloads (Pure)

Surface excitation parameter for allotropic forms of carbon

Tougaard, S. M., 2013, In : Surface and Interface Analysis. 45, 4, p. 811-816

Research output: Contribution to journalJournal articleResearchpeer-review

File
264 Downloads (Pure)

Three-Dimensional X-Ray Photoelectron Tomography on the Nanoscale: Limits of Data Processing by Principal Component Analysis

Hajati, S., Walton, J. & Tougaard, S., 2013, In : Microscopy and Microanalysis. 19, 3, p. 751-760

Research output: Contribution to journalJournal articleResearchpeer-review

File
331 Downloads (Pure)
Open Access
File
255 Downloads (Pure)