Sven Mosbæk Tougaard

PhD, dr.scient.

  • Campusvej 55

    5230 Odense M

    Denmark

1976 …2020

Research output per year

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Research Output

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Journal article
2010

Electronic and Optical Properties of Al2O3/SiO2 Thin Films grown on Si Substrate

Tahir, D., Lan Kwon, H., Chung Shin, H., Oh, S. K., Kang, H. J., Heo, S., Gwan Chung, J., Cheol Lee, J. & Tougaard, S. M., 2010, In : Journal of Physics D: Applied Physics. 43, p. 255301 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of GIZO thin film grown on SiO2/Si substrates

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 906-910

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and Optical Properties of La-aluminate Thin Films on Si (100)

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1566-1569 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Energy loss function for Si determined from reflection electron energy loss spectrawith factor analysis method

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1076-1081 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging

Tougaard, S. M., 1. Jan 2010, In : Journal of Electron Spectroscopy and Related Phenomena. 178, p. 128-153 26 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method

Tougaard, S. M., Jin, H., Shinotsuka, H., Yoshikawa, H., Iwai, H. & Tanuma, S., 2010, In : Journal of Applied Physics. 107, p. 083709-1 083709-11 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eV

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 42, p. 1100-1104

Research output: Contribution to journalJournal articleResearchpeer-review

Surface and core hole effects in X-ray photoelectron spectroscopy

Tougaard, S. M., 2010, In : Surface Science. 604, p. 1193 1196 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Surface excitation parameter for 12 semiconductors and determination of a general predictive formula

Tougaard, S. M., 2010, In : Surface and Interface Analysis. 41, 9, p. 735-740 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

XPS for non-destructive depth profiling and 3D imaging of surface nanostructures

Tougaard, S. M., 1. Jan 2010, In : Analytical and Bioanalytical Chemistry. 396, p. 2741-2755 15 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2009

Angular and Energy Dependences of Reflection Electron Energy Loss Spectra of Si

Tougaard, S. M., 2009, In : e-Journal of Surface Science and Nanotechnology. 7, p. 199-202 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Determination of the effective surface region thickness and of Begrenzungseffect

Tougaard, S. M., 1. May 2009, In : Surface Science. 603, p. 2158-2162 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Dielectric and optical properties of Zr silicate thin films grown on Si(100) by atomic layer deposition

Tougaard, S. M., 1. Jan 2009, In : Journal of Applied Physics. 106, p. 0841081-0841086 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic Scattering Cross Section of Si Determined from Angular Dependent Reflection Electron Energy Loss Spetra

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 321-324 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Non-Destructive Depth Profiling by XPS Peak Shape Analysis

Tougaard, S. M., 2009, In : Journal of Surface Analysis. 15, 3, p. 220-224 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Surface excitation parameter for selected polymers

Tougaard, S. M., 1. Jan 2009, In : Surface and Interface Analysis. 41, p. 23-26 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2008

Calculation of the angular distribution of the surface excitation parameter for Ti, Fe, Cu, Pd, Ag, and Au

Tougaard, S., 2008, In : Surface and Interface Analysis. 40, p. 731-733 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Determination of the surface excitation parameter for oxides: TiO2, SiO2, ZrO2 and Al2O3

Tougaard, S., 1. Jun 2008, In : Surface Science. 602, 11, p. 1974-1978 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Erratum: Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms[Phys. Rev. B 77, 155403 (2008)]

Hajati, S., Romanyuk, O., Zemek, J. & Tougaard, S. M., 5. Jun 2008, In : Physical Review B. 77, 249904(E), 3 p.

Research output: Contribution to journalJournal articleResearchpeer-review

First nucleation steps of nickel nanoparticle growth on Al2O3 (0001) studied by XPS inelastic peak shape analysis

Tougaard, S. M., 1. Dec 2008, In : Applied Surface Science. 255, 5, p. 3000-3003 4 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Growth mechanism of iron nanoparticles on (0001) sapphire wafers

Tougaard, S. M., 1. Nov 2008, In : Microelectronics Journal. 39, 11, p. 1374-1375 2 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 15. Sep 2008, In : Surface Science. 602, 18, p. 3064-3070 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Nondestructive quantitative XPS imaging of depth distribution of atoms on the nanoscale

Tougaard, S., 2008, In : Surface and Interface Analysis. 40, p. 688-691 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Test of validity of the V-type approach for electron trajectories in reflection electron energy loss spectroscopy

Tougaard, S., 1. Jun 2008, In : Physical Review B. 77, 24, p. Article Number: 245405 12 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical determination of the surface excitation parameter for Ti, Fe, Cu, Pd, Ag, and Au

Tougaard, S., 2008, In : Surface Science. 601, p. 5611-5615 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms

Hajati, S., Romanyuk, O., Zemek, J. & Tougaard, S., 1. Jun 2008, In : Physical Review B. 77, 24, p. 155403 15 p.

Research output: Contribution to journalJournal articleResearchpeer-review

2007

Characterization of Au nano-cluster formation on and diffusion in polystyrene using XPS peak shape analysis

Tougaard, S., 2007, In : Surface Science. 610, p. 3261-3267

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic prperties of ultrathin (HfO2)x (SiO2)1-x dielectrics on Si(100)

Tougaard, S., 2007, In : Oyo Buturi. 102, 5, p. 053709-053709-6 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical Determination of the surface excitation parameter for Ti, Fe, Cu, Pd, Au, and Au

Tougaard, S., 2007, In : Surface Science. 601, 23, p. 5611-5615

Research output: Contribution to journalJournal articleResearchpeer-review

2006

Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid Ge

Kövér, L., Novák, M., Egri, S., Cserny, I., Berényi, Z., Tóth, J., Varga, D., Drube, W., Yubero, F., Tougaard, S. & Werner, W. S. M., 2006, In : Surface and Interface Analysis. 38, p. 569-573

Research output: Contribution to journalJournal articleResearchpeer-review

Oscillating Surface Effect in Reflection-electron energy loss spectra

Pauli, N., Tougaard, S. & Yubero, F., 2006, In : Physical Review B. 73, 3, p. 035402

Research output: Contribution to journalJournal articleResearchpeer-review

Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

Sato, M., Tsukamoto, N., Shiratori, T., Furusawa, T., Suzuki, N. & Tougaard, S., 2006, In : Surface and Interface Analysis. 38, p. 604-609

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative analysis of reflection electron energy loss spectra for ultra-thin HfO2, Al2O3 and Hf-Al-O dielectric films on Si(100)

Jin, H., Oh, S. K., Kang, H. J. & Tougaard, S., 2006, In : Oyo Buturi. 100, p. 083713

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical Determination of the Surface Excitation Parameter from X-ray Photoelectron Spectroscopy

Pauli, N., Tougaard, S. & Yubero, F., 2006, In : Surface and Interface Analysis. 38, p. 672-675

Research output: Contribution to journalJournal articleResearchpeer-review

What nano-physical properties can be determined by analysis of elastic peak accompanied by its inelastic background tail in XPS and AES spectra?

Hajati, S. & Tougaard, S., 2006, In : Journal of Surface Analysis. 13, p. 148- 155

Research output: Contribution to journalJournal articleResearchpeer-review

XPS imaging of depth profiles and amount of substance based on Tougaard's algorithm

Hajati, S., Coultas, S., Blomfield, C. & Tougaard, S., 2006, In : Surface Science. p. 3015-3021

Research output: Contribution to journalJournal articleResearchpeer-review

2005

Algorithm for Automatic XPS Data Processing and XPS-Imaging

Tougaard, S., 2005, In : Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films. A 23, p. 741-745

Research output: Contribution to journalJournal articleResearchpeer-review

Electron backscattering from surfaces: Azimuth-resolved distributions

Glazov, L. & Tougaard, S., 2005, In : Physical Review B. 72, 085406.

Research output: Contribution to journalJournal articleResearchpeer-review

Quantification of plasmon excitations in core-level photoemission

Yubero, F. & Tougaard, S., 2005, In : Physical Review B. 71, p. 045414

Research output: Contribution to journalJournal articleResearchpeer-review

Test of Dielectric Response Model for Energy and Angular Dependence of Plasmon Excitations in Core Level Photoemission

Yubero, F., Kover, L., Drube, W., Eickhoff, T. & Tougaard, S., 2005, In : Surface Science. 592, p. 1-7

Research output: Contribution to journalJournal articleResearchpeer-review

Theoretical Study of the Surface Excitation Parameter from Reflection-Electron-Energy-Loss-Spectra

Pauli, N., Tougaard, S. & Yobero, F., 2005, In : Surface and Interface Analysis. 37, p. 1151-1157

Research output: Contribution to journalJournal articleResearchpeer-review

2004

Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films.

Berényi, Z., Kövér, L., Tougaard, S., Yubero, F., Tóth, J. & Cserny, I., 2004, In : Journal of Electron Spectroscopy and Related Phenomena. 135, p. 177-182

Research output: Contribution to journalJournal articleResearchpeer-review

Pulsed laser deposition of aluminum-doped ZnO films at 355 nm.

Holmelund, E., Schou, J., Thestrup, B., Tougaard, S., Johnson, E. & Nielsen, M. M., 2004, In : Applied Physics. A79, p. 1137-1139

Research output: Contribution to journalJournal articleResearchpeer-review

QUEELS Software Package for Calculation of Surface Effects in Electron Spectra.

Tougaard, S. & Yubero, F., 2004, In : Surface and Interface Analysis. 36, p. 824-827

Research output: Contribution to journalJournal articleResearchpeer-review

Surface Roughness and Island Formation effects in ARXPS quantification.

Martin-Concepción, A. I., Yubero, F., Espinos, J. P., Garcia, J. & Tougaard, S., 2004, In : Surface and Interface Analysis. 36, p. 788-792

Research output: Contribution to journalJournal articleResearchpeer-review

The Use of QUASESTM/XPS Measurements to Determine the Oxide Composition and Thickness on an Iron Substrate

Grosvenor, A. P., Kobe, B. A., McIntyre, N. S., Tougaard, S. & Lennard, W. N., 2004, In : Surface and Interface Analysis. 36, p. 632-639

Research output: Contribution to journalJournal articleResearchpeer-review

2003

Determination of amount of substance on the nanometer range consistency between XPS, RBS and XRF quantification

Martin-Concepción, A. I., Yubero, F., Espinos, J. P., Garcia, J. & Tougaard, S., 2003, In : Surface and Interface Analysis. 35, p. 984-90

Research output: Contribution to journalJournal articleResearch

Electron Backscattering from Surfaces; Invariant Embedding Approach

Glazov, L. G. & Tougaard, S., 2003, In : Physical Review B. 68, p. 155409

Research output: Contribution to journalJournal articleResearch

Experimental determination of inelastic scattering cross-sections of Si, Ge and III-V semiconductors 2003

Orosz, G. T., Gergely, G., Gurban, S., Menyhard, M., Toth, J., Varga, D. & Tougaard, S., 2003, In : Zhenkong. 71, p. 147-152

Research output: Contribution to journalJournal articleResearch