Sven Mosbæk Tougaard

PhD, dr.scient.

  • Campusvej 55

    5230 Odense M

    Denmark

1976 …2020
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Research Output 1976 2020

2020

Proliferation of Faulty Materials Data Analysis in the Literature

Linford, M. R., Smentkowski, V. S., Grant, J. T., Brundle, C. R., Sherwood, P. M. A., Biesinger, M. C., Terry, J., Artyushkova, K., Herrera-Gómez, A., Tougaard, S., Skinner, W., Pireaux, J. J., McConville, C. F., Easton, C. D., Gengenbach, T. R., Major, G. H., Dietrich, P., Thissen, A., Engelhard, M., Powell, C. J. & 2 others, Gaskell, K. J. & Baer, D. R., 17. Jan 2020, In : Microscopy and Microanalysis. 2 p.

Research output: Contribution to journalComment/debateResearchpeer-review

Universal inelastic electron scattering cross-section including extrinsic and intrinsic excitations in XPS

Gnacadja, E., Pauly, N. & Tougaard, S., 1. Jan 2020, (Accepted/In press) In : Surface and Interface Analysis.

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic scattering
Electron scattering
scattering cross sections
Energy dissipation
electron scattering
2019
26 Downloads (Pure)

Determining the Thickness and Completeness of the Shell of Polymer Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry, and Transmission Scanning Electron Microscopy

Müller, A., Heinrich, T., Tougaard, S., Werner, W. S. M., Hronek, M., Kunz, V., Radnik, J., Stockmann, J. M., Hodoroaba, V. D., Benemann, S., Nirmalananthan-Budau, N., Geißler, D., Sparnacci, K. & Unger, W. E. S., 12. Nov 2019, In : Journal of Physical Chemistry C. 123, 49, p. 29765-29775 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
completeness
Secondary ion mass spectrometry
Polytetrafluoroethylenes
secondary ion mass spectrometry
polytetrafluoroethylene

Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES

Zborowski, C. & Tougaard, S. M., 1. Aug 2019, In : Surface and Interface Analysis. 51, 8, p. 857-873

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic scattering
X ray photoelectron spectroscopy
Kinetic energy
Polymers
computer programs

XPS primary excitation spectra of Zn 2p, Fe 2p, and Ce 3d from ZnO, α-Fe2O3, and CeO2

Pauly, N., Yubero, F., Espinós, J. P. & Tougaard, S., 1. Mar 2019, In : Surface and Interface Analysis. 51, 3, p. 353-360

Research output: Contribution to journalJournal articleResearchpeer-review

X ray photoelectron spectroscopy
photoelectron spectroscopy
excitation
x rays
Metals
2018

Determination of the input parameters for inelastic background analysis combined with HAXPES using a reference sample

Zborowski, C., Renault, O., Torres, A., Yamashita, Y., Grenet, G. & Tougaard, S., 2018, In : Applied Surface Science. 432, Part A, p. 60-70

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic scattering
Scattering
Elastic scattering
Photoelectrons
Transmission electron microscopy

Impact of curing time on ageing and degradation of phenol-urea-formaldehyde binder

Okhrimenko, D. V., Thomsen, A. B., Ceccato, M., Johansson, D. B., Lybye, D., Bechgaard, K., Tougaard, S. & Stipp, S. L. S., 2018, In : Polymer Degradation and Stability. 152, p. 86-94

Research output: Contribution to journalJournal articleResearchpeer-review

Phenol
curing
formaldehyde
ureas
Formaldehyde

Improved XPS analysis by visual inspection of the survey spectrum

Tougaard, S. M., 2018, In : Surface and Interface Analysis. 50, 6, p. 657-666

Research output: Contribution to journalJournal articleResearchpeer-review

Photoelectron spectroscopy
inspection
Inspection
photoelectron spectroscopy
attenuation

Quantitative analysis of Yb 4d photoelectron spectrum of metallic Yb

Pauly, N., Yubero, F. & Tougaard, S. M., 2018, In : Surface and Interface Analysis. 50, 11, p. 1168-1173

Research output: Contribution to journalJournal articleResearchpeer-review

Photoelectrons
quantitative analysis
photoelectrons
X ray photoelectron spectroscopy
Chemical analysis
44 Downloads (Pure)

Quantitative determination of elemental diffusion from deeply buried layers by photoelectron spectroscopy

Tougaard, S. M., 2018, In : Journal of Applied Physics. 124, 8, 085115.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
photoelectron spectroscopy
fabrication
annealing
transistors
transmission electron microscopy
2017
11 Downloads (Pure)

Effective inelastic scattering cross-sections for background analysis in HAXPES of deeply buried layers

Risterucci, P., Renault, O., Zborowski, C., Bertrand, D., Torres, A., Rueff, J-P., Ceolin, D., Grenet, G. & Tougaard, S. M., 2017, In : Applied Surface Science. 402, p. 78-85

Research output: Contribution to journalJournal articleResearchpeer-review

Inelastic scattering
Photoelectrons
Scattering
Core levels
Annealing

Novel applications of inelastic background XPS analysis:3D imaging and HAXPES

Tougaard, S. M., 2017, In : Journal of Surface Analysis. 24, 2, p. 107-114

Research output: Contribution to journalJournal articleResearchpeer-review

Optical properties and electronic transitions of zinc oxide, ferric oxide, cerium oxide, and samarium oxide in the ultraviolet and extreme ultraviolet

Pauly, N., Yubero, F., Espinós, J. P. & Tougaard, S., 2017, In : Applied Optics. 56, 23, p. 6611-6621

Research output: Contribution to journalJournal articleResearchpeer-review

cerium oxides
Samarium
samarium
Cerium
Zinc oxide
120 Downloads (Pure)

Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Cui, Y-T., Tougaard, S. M., Oji, H., Son, J-Y., Sakamoto, Y., Matsumoto, T., Yang, A., Sakata, O., Song, H. & Hirosawa, I., 2017, In : Journal of Applied Physics. 121, 10 p., 225307.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
2016
228 Downloads (Pure)

Band-Gap Widening at the Cu(In,Ga)(S,Se)2 Surface: A Novel Determination Approach Using Reflection Electron Energy Loss Spectroscopy

Hauschild, D., Handick, E., Gö hl-Gusenleitner, S., Meyer, F., Schwab, H., Benkert, A., Pohlner, S., Palm, J., Tougaard, S. M., Heske, C., Weinhardt, L. & Reinert, F., 2016, In : A C S Applied Materials and Interfaces. 8, 32, p. 21101-21105

Research output: Contribution to journalJournal articleResearchpeer-review

File
11 Downloads (Pure)

Composition dependence of dielectric and optical properties of Hf-Zr-silicate thin films grown on Si(100) by atomic layer deposition

Tahir, D., Oh, S. K., Kang, H. J. & Tougaard, S. M., 2016, In : Thin Solid Films. 616, p. 425-430

Research output: Contribution to journalJournal articleResearchpeer-review

27 Downloads (Pure)

Determination of electronic properties of nanostructures using reflection electron energy loss spectroscopy: Nano-metalized polymer as case study

Deris, J., Hajati, S., Tougaard, S. M. & Zaporojtchenko, V., 2016, In : Applied Surface Science. 377, p. 44-47

Research output: Contribution to journalJournal articleResearchpeer-review

60 Downloads (Pure)

Quantitative analysis of Ni 2p photoemission in NiO and Ni diluted in a SiO2 matrix

Pauly, N., Yubero, F., García-García, F. J. & Tougaard, S. M., 2016, In : Surface Science. 644, p. 46-52

Research output: Contribution to journalJournal articleResearchpeer-review

51 Downloads (Pure)

Quantitative analysis of reflection electron energy loss spectra to determine electronic and optical properties of Fe–Ni alloy thin films

Tahir, D., Oh, S. K., Kang, H. J. & Tougaard, S. M., 2016, In : Journal of Electron Spectroscopy and Related Phenomena. 206, p. 6-11

Research output: Contribution to journalJournal articleResearchpeer-review

Quantitative analysis of satellite structures in XPS spectra of gold and silver

Pauly, N., Yubero, F. & Tougaard, S. M., 2016, In : Applied Surface Science. 383, p. 317-323

Research output: Contribution to journalJournal articleResearchpeer-review

135 Downloads (Pure)

Quantitative spectromicroscopy from inelastically scattered photoelectrons in the hard X-ray range

Renault, O., Zborowski, C., Risterucci, P., Wiemann, C., Grenet, G., Schneider, C. M. & Tougaard, S. M., 2016, In : Applied Physics Letters. 109, 1, 5 p., 011602.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
2015
625 Downloads (Pure)
File

Primary excitation spectra in XPS and AES of Cu, CuO: Relative importance of surface and core hole effects

Pauly, N. & Tougaard, S. M., 2015, In : Surface Science. 641, p. 326-329

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
2014
434 Downloads (Pure)

Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO

Tougaard, S. M., 2014, In : Surface Science. 620, p. 17-22

Research output: Contribution to journalJournal articleResearchpeer-review

File
243 Downloads (Pure)

Electronic and optical properties of Fe, Pd, and Ti studied by reflection electron energy loss spectroscopy

Tougaard, S. M., 2014, In : Journal of Applied Physics. 115, 243508 , 6 p., 243508 .

Research output: Contribution to journalJournal articleResearchpeer-review

File
278 Downloads (Pure)

Inelastic background analysis of HAXPES spectra: towards enhanced bulk sensitivity in photoemission

Tougaard, S. M., 2014, In : Surface and Interface Analysis. 46, p. 906-910 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
358 Downloads (Pure)

LMM Auger primary excitation spectra of copper

Tougaard, S. M., 2014, In : Surface Science. 630, p. 294-299 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File

Modeling of X-ray photoelectron spectra-surface and core hole effects

Tougaard, S. M., 2014, In : Surface and Interface Analysis. 46, 10-11, p. 920-923 4 p., DOI 10.1002/sia.5372.

Research output: Contribution to journalJournal articleResearchpeer-review

Morphology of Ferromagnetic Cobalt Nanoparticles Grown on Al2O3 (0001) by Pulsed Laser Deposition

Tougaard, S. M., 2014, In : Journal of Advanced Microscopy Research. 8, p. 1-6, p. 1-6 6 p.

Research output: Contribution to journalJournal articleResearchpeer-review

352 Downloads (Pure)

Probing deeper by Hard X-ray Photoelectron Spectroscopy

Tougaard, S. M., 2014, In : Applied Physics Letters. 104, 5, 4 p., 051608.

Research output: Contribution to journalJournal articleResearchpeer-review

File

The growth of cobalt oxides on HOPG and SiO2 surfaces: A comparative study

Tougaard, S. M., 2014, In : Surface Science. 624, June, p. 145-153

Research output: Contribution to journalJournal articleResearchpeer-review

2013
528 Downloads (Pure)
Open Access
File
Electron reflection
factor analysis
Factor analysis
Energy dissipation
energy dissipation
359 Downloads (Pure)

Factor analysis and advanced inelastic background analysis in XPS: Unraveling time dependent contamination growth on multilayers and thin films

Tougaard, S. M., 2013, In : Surface Science. 616, p. 161-165 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
325 Downloads (Pure)

Sample-morphology effects on x-ray photoelectron peak intensities

Tougaard, S. M., 2013, In : Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films. 31, 2, p. 021402-1 to 021402-7 8 p., 021402.

Research output: Contribution to journalJournal articleResearchpeer-review

Open Access
File
Elastic scattering
Photoelectrons
elastic scattering
photoelectrons
X rays
222 Downloads (Pure)

Surface excitation parameter for allotropic forms of carbon

Tougaard, S. M., 2013, In : Surface and Interface Analysis. 45, 4, p. 811-816

Research output: Contribution to journalJournal articleResearchpeer-review

File
Carbon
carbon
excitation
Electrons
Diamond
289 Downloads (Pure)

Three-Dimensional X-Ray Photoelectron Tomography on the Nanoscale: Limits of Data Processing by Principal Component Analysis

Hajati, S., Walton, J. & Tougaard, S., 2013, In : Microscopy and Microanalysis. 19, 3, p. 751-760

Research output: Contribution to journalJournal articleResearchpeer-review

File
Photoelectrons
principal components analysis
Principal component analysis
Tomography
photoelectrons
218 Downloads (Pure)
Open Access
File
Photoelectron spectroscopy
x ray spectroscopy
photoelectron spectroscopy
X rays
Atoms

X-ray Photoelectron Spectroscopy-Elsevier Reference Module in Chemistry, Molecular Sciences and Chemical Engineering

Tougaard, S. M., 2013, Elsevier Reference Module in Chemistry, Molecular Sciences and Chemical Engineering. Reedijk, J. (ed.). Elsevier, 11 p.

Research output: Chapter in Book/Report/Conference proceedingEncyclopedia chapterResearchpeer-review

2012
183 Downloads (Pure)

Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 1147-1150

Research output: Contribution to journalJournal articleResearchpeer-review

File
158 Downloads (Pure)

Dielectric description of the angular dependence of the loss structure in core level photoemission

Tougaard, S. M., 2012, In : Journal of Electron Spectroscopy and Related Phenomena. 185, p. 552-558

Research output: Contribution to journalJournal articleResearchpeer-review

File

Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy

Tougaard, S. M., 2012, In : Journal of Physics: Condensed Matter. 24, p. 175002 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS

Tougaard, S. M., 2012, In : Journal of Electron Spectroscopy and Related Phenomena. 185, p. 18-22 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Electronic and optical properties of selected polymers studied by reflection electron spectroscopy

Tougaard, S. M., 2012, In : Journal of Applied Physics. 111, p. 054101-1 -054101-7 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

551 Downloads (Pure)

Reflection electron energy loss spectroscopy for ultrathin gate oxide materials

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 623-627 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
195 Downloads (Pure)

Software package to calculate the effects of the core hole and surface excitations on XPS and AES

Tougaard, S. M., 2012, In : Surface and Interface Analysis. 44, p. 1114-1118 5 p.

Research output: Contribution to journalJournal articleResearchpeer-review

File
2011

Controlled adhesion of Salmonella Typhimurium to poly(oligoethylene glycol methacrylate) grafts

Mrabet, B., Mejbri, A., Machouche, S., Gam-Derouich, S., Turmine, M., Mechouet, M., Lang, P., Bakala, H., Bakrouf, A., Tougaard, S. M. & Chehimi, M. M., 2011, In : Surface and Interface Analysis. 43, 11, p. 1436-1443

Research output: Contribution to journalJournal articleResearchpeer-review

Core hole and surface excitation correction parameter for XPS peak intensities

Tougaard, S. M., 2011, In : Surface Science. 605, p. 1556-1562 7 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Dielectric response functions of the (0001), and (1013) GaN single crystalline and disordered surfaces studied by reflection electron energy loss spectroscopy

Tougaard, S. M., 2011, In : Journal of Applied Physics. 110, p. 043507-01-043507-07 8 p.

Research output: Contribution to journalJournal articleResearchpeer-review

Experimental verification of the shape of the excitation depth distribution function for AES

Tougaard, S. M. & Jablonski, A., 2011, In : Journal of Vacuum Science & Technology. A: International Journal Devoted to Vacuum, Surfaces, and Films. A29, p. 051401-1 to 051401-10 11 p.

Research output: Contribution to journalJournal articleResearchpeer-review