9:20 a.m. – 9:40 a.m. (T3.3.) Sputter/Auger Depth Profiling of Au--‐on--‐Alumina Nanostructures: Improving Data Reduction and Analysis Capabilities, Per Morgen1,a, Martin Hedegaard2, Ole Albrektsen2 and Peter Nielsen1,2, 1Department of Physics and Chemistry, 2ITI Institute, University of Southern Denmark (SDU), Campusvej 55, DK--‐5230 Odense M, Denmark

Activity: Talks and presentationsTalks and presentations in private or public companies

Period12. Apr 2011
Event titleSurface Analysis 2011
Event typeConference
LocationAlbany, United States