What von Neumann did not say about multiplexing beyond gate failures - The gory details

Valeriu Beiu*, Walid Ibrahim, Sanja Lazarova-Molnar

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Abstrakt

This paper presents an exact reliability analysis of von Neumann multiplexing using majority gates of fan-in A = 3,5,7,9,11, and the corresponding minimum redundancy factors R = 6,10,14,18,22. Such results are extremely important for a deeper understanding of von Neumann multiplexing (and its variations), especially when considering the expected unreliable behavior of future nano-devices and interconnects. The analysis confirms and augments well-known theoretical results, and is exact as being obtained using exhaustive counting. The extension of the analysis to the device level will allow us to characterize von Neumann multiplexing with respect to device failures for the first time. The results are very timely and are also explaining a strange (non-linear) behavior of von Neuman multiplexing reported two years ago (based on extensive Monte Carlo simulations).

OriginalsprogEngelsk
TitelComputational and Ambient Intelligence - 9th International Work-Conference on Artificial Neural Networks, IWANN 2007, Proceedings
Antal sider10
Publikationsdato1. dec. 2007
Sider487-496
ISBN (Trykt)9783540730064
StatusUdgivet - 1. dec. 2007
Begivenhed9th International Work-Conference on Artificial Neural Networks, IWANN 2007 - San Sebastian, Spanien
Varighed: 20. jun. 200722. jun. 2007

Konference

Konference9th International Work-Conference on Artificial Neural Networks, IWANN 2007
LandSpanien
BySan Sebastian
Periode20/06/200722/06/2007
NavnLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Vol/bind4507 LNCS
ISSN0302-9743

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