Abstract
Common mode currents on attached cables are often the dominant source of unwanted emissions at frequencies below 400 MHz as the cables act as unwanted antennas. High coupling to these cables combined with strong near-fields are seen as two conditions for radiated emission. This paper introduces a novel method and workflow to use near-field scanning results to visualize areas with high coupling to attached cables from a device. The method is successfully demonstrated on a simple device and thereafter in a case study.
| Originalsprog | Engelsk |
|---|---|
| Titel | 2024 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) |
| Forlag | IEEE |
| Publikationsdato | aug. 2024 |
| Sider | 422-428 |
| ISBN (Elektronisk) | 9798350360394 |
| DOI | |
| Status | Udgivet - aug. 2024 |
| Begivenhed | 2024 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2024 - Phoenix, USA Varighed: 5. aug. 2024 → 9. aug. 2024 |
Konference
| Konference | 2024 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2024 |
|---|---|
| Land/Område | USA |
| By | Phoenix |
| Periode | 05/08/2024 → 09/08/2024 |
| Navn | Proceedings - IEEE International Symposium on Electromagnetic Compatibility (EMC) |
|---|---|
| ISSN | 2158-110X |
Bibliografisk note
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