Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Yi-Tao Cui; Sven Mosbæk Tougaard; Hiroshi Oji; Jin-Young Son; Yasuhiro Sakamoto; Takuya Matsumoto; Anli Yang; Osami Sakata; Huaping Song; Ichiro Hirosawa

doi:10.1063/1.4985176

Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Yi-Tao Cui, Sven Mosbæk Tougaard, Hiroshi Oji, Jin-Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa

Institut for Fysik, Kemi og Farmaci

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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Originalsprog	Engelsk
Artikelnummer	225307
Tidsskrift	Journal of Applied Physics
Vol/bind	121
Antal sider	10
ISSN	0021-8979
DOI	https://doi.org/10.1063/1.4985176
Status	Udgivet - 2017

Dokumenter og links

10.1063/1.4985176

Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopyForlagets udgivne version, 2,86 MB

Citationsformater

@article{655be9af0e9142ab9af72549e2907272,

title = "Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy",

author = "Yi-Tao Cui and Tougaard, {Sven Mosb{\ae}k} and Hiroshi Oji and Jin-Young Son and Yasuhiro Sakamoto and Takuya Matsumoto and Anli Yang and Osami Sakata and Huaping Song and Ichiro Hirosawa",

year = "2017",

doi = "10.1063/1.4985176",

language = "English",

volume = "121",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

}

Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy. / Cui, Yi-Tao; Tougaard, Sven Mosbæk; Oji, Hiroshi; Son, Jin-Young; Sakamoto, Yasuhiro; Matsumoto, Takuya; Yang, Anli; Sakata, Osami; Song, Huaping; Hirosawa, Ichiro.

I: Journal of Applied Physics, Bind 121, 225307, 2017.

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

TY - JOUR

T1 - Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

AU - Cui, Yi-Tao

AU - Tougaard, Sven Mosbæk

AU - Oji, Hiroshi

AU - Son, Jin-Young

AU - Sakamoto, Yasuhiro

AU - Matsumoto, Takuya

AU - Yang, Anli

AU - Sakata, Osami

AU - Song, Huaping

AU - Hirosawa, Ichiro

PY - 2017

Y1 - 2017

U2 - 10.1063/1.4985176

DO - 10.1063/1.4985176

M3 - Journal article

VL - 121

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

M1 - 225307

ER -