Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Yi-Tao Cui, Sven Mosbæk Tougaard, Hiroshi Oji, Jin-Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa

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OriginalsprogEngelsk
Artikelnummer225307
TidsskriftJournal of Applied Physics
Vol/bind121
Antal sider10
ISSN0021-8979
DOI
StatusUdgivet - 2017

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