Originalsprog | Engelsk |
---|---|
Artikelnummer | 225307 |
Tidsskrift | Journal of Applied Physics |
Vol/bind | 121 |
Antal sider | 10 |
ISSN | 0021-8979 |
DOI | |
Status | Udgivet - 2017 |
Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy
Yi-Tao Cui, Sven Mosbæk Tougaard, Hiroshi Oji, Jin-Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review
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