Abstract
Two-photon photoemission electron microscopy
(2P-PEEM) is used to measure the real and imaginary
part of the dispersion relation of surface plasmon polaritons
at different interface systems. A comparison of calculated
and measured dispersion data for a gold/vacuum interface
demonstrates the capability of the presented experimental
approach. A systematic 2P-PEEM study on the dispersion
relation of dielectric-loaded gold surfaces shows how
effective the propagation of surface plasmon polaritons at a
gold/para-hexaphenylene interface can be tuned by
adjustment of the dielectric film thickness. Deviations of
the experimental results from effective index calculations
indicate the relevance of thin film peculiarities arising from
the details of the growth process and corroborate the need
of experimental analysis techniques for dispersion relation
measurements.
(2P-PEEM) is used to measure the real and imaginary
part of the dispersion relation of surface plasmon polaritons
at different interface systems. A comparison of calculated
and measured dispersion data for a gold/vacuum interface
demonstrates the capability of the presented experimental
approach. A systematic 2P-PEEM study on the dispersion
relation of dielectric-loaded gold surfaces shows how
effective the propagation of surface plasmon polaritons at a
gold/para-hexaphenylene interface can be tuned by
adjustment of the dielectric film thickness. Deviations of
the experimental results from effective index calculations
indicate the relevance of thin film peculiarities arising from
the details of the growth process and corroborate the need
of experimental analysis techniques for dispersion relation
measurements.
| Originalsprog | Engelsk |
|---|---|
| Tidsskrift | Applied Physics B |
| Vol/bind | 116 |
| Udgave nummer | 3 |
| Sider (fra-til) | 585-591 |
| Antal sider | 7 |
| ISSN | 0946-2171 |
| DOI | |
| Status | Udgivet - 1. sep. 2014 |