The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

Christoph Lemke, Till Leißner, Alwin Klick, Jacek Fiutowski, Jörn W. Radke, Martin Thomaschewski, Jakob Kjelstrup-Hansen, Horst-Günter Rubahn, Michael Bauer

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Two-photon photoemission electron microscopy
(2P-PEEM) is used to measure the real and imaginary
part of the dispersion relation of surface plasmon polaritons
at different interface systems. A comparison of calculated
and measured dispersion data for a gold/vacuum interface
demonstrates the capability of the presented experimental
approach. A systematic 2P-PEEM study on the dispersion
relation of dielectric-loaded gold surfaces shows how
effective the propagation of surface plasmon polaritons at a
gold/para-hexaphenylene interface can be tuned by
adjustment of the dielectric film thickness. Deviations of
the experimental results from effective index calculations
indicate the relevance of thin film peculiarities arising from
the details of the growth process and corroborate the need
of experimental analysis techniques for dispersion relation
measurements.
OriginalsprogEngelsk
TidsskriftApplied physics. B, Lasers and optics (Print)
Vol/bind116
Udgave nummer3
Sider (fra-til)585-591
Antal sider7
ISSN0946-2171
DOI
StatusUdgivet - 1. sep. 2014

Fingeraftryk

Gold
Dielectric films
Photoemission
Electron microscopy
Film thickness
Photons
Vacuum
Thin films

Citer dette

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title = "The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces",
abstract = "Two-photon photoemission electron microscopy(2P-PEEM) is used to measure the real and imaginarypart of the dispersion relation of surface plasmon polaritonsat different interface systems. A comparison of calculatedand measured dispersion data for a gold/vacuum interfacedemonstrates the capability of the presented experimentalapproach. A systematic 2P-PEEM study on the dispersionrelation of dielectric-loaded gold surfaces shows howeffective the propagation of surface plasmon polaritons at agold/para-hexaphenylene interface can be tuned byadjustment of the dielectric film thickness. Deviations ofthe experimental results from effective index calculationsindicate the relevance of thin film peculiarities arising fromthe details of the growth process and corroborate the needof experimental analysis techniques for dispersion relationmeasurements.",
author = "Christoph Lemke and Till Lei{\ss}ner and Alwin Klick and Jacek Fiutowski and Radke, {J{\"o}rn W.} and Martin Thomaschewski and Jakob Kjelstrup-Hansen and Horst-G{\"u}nter Rubahn and Michael Bauer",
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month = "9",
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doi = "10.1007/s00340-013-5737-2",
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pages = "585--591",
journal = "Applied Physics B",
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The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces. / Lemke, Christoph; Leißner, Till; Klick, Alwin; Fiutowski, Jacek; Radke, Jörn W.; Thomaschewski, Martin; Kjelstrup-Hansen, Jakob; Rubahn, Horst-Günter; Bauer, Michael.

I: Applied physics. B, Lasers and optics (Print), Bind 116, Nr. 3, 01.09.2014, s. 585-591.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

AU - Lemke, Christoph

AU - Leißner, Till

AU - Klick, Alwin

AU - Fiutowski, Jacek

AU - Radke, Jörn W.

AU - Thomaschewski, Martin

AU - Kjelstrup-Hansen, Jakob

AU - Rubahn, Horst-Günter

AU - Bauer, Michael

PY - 2014/9/1

Y1 - 2014/9/1

N2 - Two-photon photoemission electron microscopy(2P-PEEM) is used to measure the real and imaginarypart of the dispersion relation of surface plasmon polaritonsat different interface systems. A comparison of calculatedand measured dispersion data for a gold/vacuum interfacedemonstrates the capability of the presented experimentalapproach. A systematic 2P-PEEM study on the dispersionrelation of dielectric-loaded gold surfaces shows howeffective the propagation of surface plasmon polaritons at agold/para-hexaphenylene interface can be tuned byadjustment of the dielectric film thickness. Deviations ofthe experimental results from effective index calculationsindicate the relevance of thin film peculiarities arising fromthe details of the growth process and corroborate the needof experimental analysis techniques for dispersion relationmeasurements.

AB - Two-photon photoemission electron microscopy(2P-PEEM) is used to measure the real and imaginarypart of the dispersion relation of surface plasmon polaritonsat different interface systems. A comparison of calculatedand measured dispersion data for a gold/vacuum interfacedemonstrates the capability of the presented experimentalapproach. A systematic 2P-PEEM study on the dispersionrelation of dielectric-loaded gold surfaces shows howeffective the propagation of surface plasmon polaritons at agold/para-hexaphenylene interface can be tuned byadjustment of the dielectric film thickness. Deviations ofthe experimental results from effective index calculationsindicate the relevance of thin film peculiarities arising fromthe details of the growth process and corroborate the needof experimental analysis techniques for dispersion relationmeasurements.

U2 - 10.1007/s00340-013-5737-2

DO - 10.1007/s00340-013-5737-2

M3 - Journal article

VL - 116

SP - 585

EP - 591

JO - Applied Physics B

JF - Applied Physics B

SN - 0946-2171

IS - 3

ER -