Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning

Shubhankar Marathe*, Zongyi Chen, Kaustav Ghosh, Hamed Kajbaf, Stephan Frei, Morten Sorensen, David Pommerenke, Jin Min

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Often, electromagnetic interference (EMI) scanning applications require phase and magnitude information for the creation of equivalent radiation models and far-field predictions. Magnitude information can be obtained using a spectrum analyzer (SA), which is relatively inexpensive compared to phase resolving instruments such as vector network analyzers (VNAs) and oscilloscopes at tens of GHz. This paper introduces and optimizes a cost-effective SA-based phase measurement method and compares the results to a VNA and oscilloscope-based methods for EMI signal sources. The measured-phase distribution obtained from the three different instruments is additionally compared with the simulated phase determined from full-wave simulation. The three measurement methods are compared based on the type of signal spectrum to be measured, such as single or multiple frequencies, signals requiring low-resolution bandwidth measurements, or transient signal events. The SA-based phase measurement technique is designed to operate from 5 to 12 GHz. However, the system frequency bandwidth is limited only by the frequency bandwidth of the individual RF components used in the SA measurement system.

TidsskriftIEEE Transactions on Electromagnetic Compatibility
Udgave nummer3
Sider (fra-til)848-858
StatusUdgivet - jun. 2020
Udgivet eksterntJa

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