Sensory profiling of high-end loudspeakers using rapid methods - Part 2

Projective Mapping with Expert and Naïve Assessors

Davide Giacalone, Maciej Nitkiewicz, Samuel Moulin, Torstein Boðason, Jakob Lund Laugesen, Søren Bech

Publikation: Konferencebidrag uden forlag/tidsskriftPaperForskningpeer review

OriginalsprogEngelsk
Publikationsdato2017
Antal sider14
StatusUdgivet - 2017
Begivenhed142nd Audio Engineering Society Convention - Berlin, Tyskland
Varighed: 20. mar. 201723. mar. 2017
Konferencens nummer: 142
http://www.aes.org/events/142/

Konference

Konference142nd Audio Engineering Society Convention
Nummer142
LandTyskland
ByBerlin
Periode20/03/201723/03/2017
Internetadresse

Citer dette

Giacalone, D., Nitkiewicz, M., Moulin, S., Boðason, T., Laugesen, J. L., & Bech, S. (2017). Sensory profiling of high-end loudspeakers using rapid methods - Part 2: Projective Mapping with Expert and Naïve Assessors. Afhandling præsenteret på 142nd Audio Engineering Society Convention, Berlin, Tyskland.
Giacalone, Davide ; Nitkiewicz, Maciej ; Moulin, Samuel ; Boðason, Torstein ; Laugesen, Jakob Lund ; Bech, Søren. / Sensory profiling of high-end loudspeakers using rapid methods - Part 2 : Projective Mapping with Expert and Naïve Assessors. Afhandling præsenteret på 142nd Audio Engineering Society Convention, Berlin, Tyskland.14 s.
@conference{36235b12d5a24ceaa2961b8d05ba98b3,
title = "Sensory profiling of high-end loudspeakers using rapid methods - Part 2: Projective Mapping with Expert and Na{\"i}ve Assessors",
author = "Davide Giacalone and Maciej Nitkiewicz and Samuel Moulin and Torstein Bo{\dh}ason and Laugesen, {Jakob Lund} and S{\o}ren Bech",
year = "2017",
language = "English",
note = "142nd Audio Engineering Society Convention, AES Convention ; Conference date: 20-03-2017 Through 23-03-2017",
url = "http://www.aes.org/events/142/",

}

Giacalone, D, Nitkiewicz, M, Moulin, S, Boðason, T, Laugesen, JL & Bech, S 2017, 'Sensory profiling of high-end loudspeakers using rapid methods - Part 2: Projective Mapping with Expert and Naïve Assessors' Paper fremlagt ved 142nd Audio Engineering Society Convention, Berlin, Tyskland, 20/03/2017 - 23/03/2017, .

Sensory profiling of high-end loudspeakers using rapid methods - Part 2 : Projective Mapping with Expert and Naïve Assessors. / Giacalone, Davide ; Nitkiewicz, Maciej; Moulin, Samuel; Boðason, Torstein; Laugesen, Jakob Lund; Bech, Søren.

2017. Afhandling præsenteret på 142nd Audio Engineering Society Convention, Berlin, Tyskland.

Publikation: Konferencebidrag uden forlag/tidsskriftPaperForskningpeer review

TY - CONF

T1 - Sensory profiling of high-end loudspeakers using rapid methods - Part 2

T2 - Projective Mapping with Expert and Naïve Assessors

AU - Giacalone, Davide

AU - Nitkiewicz, Maciej

AU - Moulin, Samuel

AU - Boðason, Torstein

AU - Laugesen, Jakob Lund

AU - Bech, Søren

PY - 2017

Y1 - 2017

M3 - Paper

ER -

Giacalone D, Nitkiewicz M, Moulin S, Boðason T, Laugesen JL, Bech S. Sensory profiling of high-end loudspeakers using rapid methods - Part 2: Projective Mapping with Expert and Naïve Assessors. 2017. Afhandling præsenteret på 142nd Audio Engineering Society Convention, Berlin, Tyskland.