Second-harmonic scanning optical microscopy of individual nanostructures

Sergei I. Bozhevolnyi, Valeri Z. Lozovski

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Second-harmonic far- and near-field optical microscopy of individual subwavelength-sized objects placed on a substrate surface is considered by making use of a macroscopic self-consistent approach for second-harmonic microscopy extended to take into account the presence of a (linear or nonlinear) substrate. Second-harmonic optical images in the illumination configuration are calculated for the cases with a scanning Gaussian beam and with a scanning probe being the source of illumination. Object-substrate combinations with various nonlinear properties are considered for different polarization configurations of illuminating and detected radiation. We show that the symmetry of second-harmonic images is strongly influenced by the nonlinear properties of the object and substrate. The results obtained are discussed and related to the available experimental images.
OriginalsprogEngelsk
Artikelnummer235420
TidsskriftPhysical Review B
Vol/bind65
Udgave nummer23
Antal sider10
ISSN2469-9950
DOI
StatusUdgivet - 2002
Udgivet eksterntJa

Fingeraftryk

Optical microscopy
Nanostructures
microscopy
Scanning
harmonics
scanning
Substrates
Lighting
illumination
Gaussian beams
configurations
illuminating
far fields
near fields
Microscopic examination
Polarization
Radiation
probes
symmetry
polarization

Citer dette

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Second-harmonic scanning optical microscopy of individual nanostructures. / Bozhevolnyi, Sergei I.; Lozovski, Valeri Z.

I: Physical Review B, Bind 65, Nr. 23, 235420, 2002.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Second-harmonic scanning optical microscopy of individual nanostructures

AU - Bozhevolnyi, Sergei I.

AU - Lozovski, Valeri Z.

PY - 2002

Y1 - 2002

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AB - Second-harmonic far- and near-field optical microscopy of individual subwavelength-sized objects placed on a substrate surface is considered by making use of a macroscopic self-consistent approach for second-harmonic microscopy extended to take into account the presence of a (linear or nonlinear) substrate. Second-harmonic optical images in the illumination configuration are calculated for the cases with a scanning Gaussian beam and with a scanning probe being the source of illumination. Object-substrate combinations with various nonlinear properties are considered for different polarization configurations of illuminating and detected radiation. We show that the symmetry of second-harmonic images is strongly influenced by the nonlinear properties of the object and substrate. The results obtained are discussed and related to the available experimental images.

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DO - 10.1103/PhysRevB.65.235420

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JO - Physical Review B

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