Sampling criterion for EMC near field measurements

O. Franek*, M. Sørensen, H. Ebert, G. F. Pedersen

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Abstrakt

An alternative, quasi-empirical sampling criterion for EMC near field measurements intended for close coupling investigations is proposed. The criterion is based on maximum error caused by sub-optimal sampling of near fields in the vicinity of an elementary dipole, which is suggested as a worst-case representative of a signal trace on a typical printed circuit board. It has been found that the sampling density derived in this way is in fact very similar to that given by the antenna near field sampling theorem, if an error less than 1 dB is required. The principal advantage of the proposed formulation is its parametrization with respect to the desired maximum error in measurements. This allows the engineer performing the near field scan to choose a suitable compromise between accuracy and measurement time.

OriginalsprogEngelsk
TitelPIERS 2012 Kuala Lumpur - Progress in Electromagnetics Research Symposium, Proceedings
Antal sider4
Publikationsdato12. nov. 2012
Sider38-41
ISBN (Trykt)9781934142202
StatusUdgivet - 12. nov. 2012
BegivenhedProgress in Electromagnetics Research Symposium, PIERS 2012 Kuala Lumpur - Kuala Lumpur, Malaysia
Varighed: 27. mar. 201230. mar. 2012

Konference

KonferenceProgress in Electromagnetics Research Symposium, PIERS 2012 Kuala Lumpur
Land/OmrådeMalaysia
ByKuala Lumpur
Periode27/03/201230/03/2012
SponsorTELEKOM Malaysia, TELEKOM Malaysia Research and Development, Motorola Solutions, Malaysia Convention and Exhibition Bureau (MyCeb)
NavnProgress in Electromagnetics Research Symposium
ISSN1559-9450

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