Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms

H. B. Zhang, C Henkel, E. Haller, Stefan Wildermuth, S. Hofferberth, Peter Krüger, Jörg Schmiedmayer

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the center of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.

OriginalsprogEngelsk
TidsskriftThe European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics
Vol/bind35
Udgave nummer1
Sider (fra-til)97-104
Antal sider8
ISSN1434-6060
DOI
StatusUdgivet - aug. 2005

Fingeraftryk

chips
life (durability)
Atoms
atoms
Scaling laws
Green's function
noise spectra
Wire
Vacuum
scaling laws
Membranes
Green's functions
traps
wire
membranes
reflectance
conductivity
vacuum
Experiments
Hot Temperature

Citer dette

Zhang, H. B. ; Henkel, C ; Haller, E. ; Wildermuth, Stefan ; Hofferberth, S. ; Krüger, Peter ; Schmiedmayer, Jörg. / Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms. I: The European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics. 2005 ; Bind 35, Nr. 1. s. 97-104.
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Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms. / Zhang, H. B.; Henkel, C; Haller, E.; Wildermuth, Stefan; Hofferberth, S.; Krüger, Peter; Schmiedmayer, Jörg.

I: The European Physical Journal D: Atomic, Molecular, Optical and Plasma Physics, Bind 35, Nr. 1, 08.2005, s. 97-104.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Relevance of sub-surface chip layers for the lifetime of magnetically trapped atoms

AU - Zhang, H. B.

AU - Henkel, C

AU - Haller, E.

AU - Wildermuth, Stefan

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AU - Krüger, Peter

AU - Schmiedmayer, Jörg

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AB - We investigate the lifetime of magnetically trapped atoms above a planar, layered atom chip structure. Numerical calculations of the thermal magnetic noise spectrum are performed, based on the exact magnetic Green function and multi layer reflection coefficients. We have performed lifetime measurements where the center of a side guide trap is laterally shifted with respect to the current carrying wire using additional bias fields. Comparing the experiment to theory, we find a fair agreement and demonstrate that for a chip whose topmost layer is metallic, the magnetic noise depends essentially on the thickness of that layer, as long as the layers below have a much smaller conductivity; essentially the same magnetic noise would be obtained with a metallic membrane suspended in vacuum. Based on our theory we give general scaling laws of how to reduce the effect of surface magnetic noise on the trapped atoms.

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