QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Sven Tougaard; Nicolas Pauly; Francisco Yubero

doi:10.1002/sia.7095

QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Sven Tougaard^*, Nicolas Pauly, Francisco Yubero

^*Kontaktforfatter

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

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Abstrakt

We present the user-friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response description, for swift electrons travelling nearby surfaces in several environments. We briefly describe the underlying theoretical models and illustrate its use to evaluate the distribution of energy losses taking place in electron spectroscopies like transmission electron energy loss spectroscopy (TEELS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS), which are widely used for material analysis. This includes the intrinsic excitations due to the core hole in XPS and AES.

Originalsprog	Engelsk
Tidsskrift	Surface and Interface Analysis
Vol/bind	54
Udgave nummer	7
Sider (fra-til)	820-833
ISSN	0142-2421
DOI	https://doi.org/10.1002/sia.7095
Status	Udgivet - jul. 2022

Bibliografisk note

Publisher Copyright:
© 2022 The Authors. Surface and Interface Analysis published by John Wiley & Sons Ltd.

Dokumenter og links

10.1002/sia.7095Licens: CC BY-NC-ND

Open access versionForlagets udgivne version, 3,7 MBLicens: CC BY-NC-ND

Citationsformater

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title = "QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole",

abstract = "We present the user-friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response description, for swift electrons travelling nearby surfaces in several environments. We briefly describe the underlying theoretical models and illustrate its use to evaluate the distribution of energy losses taking place in electron spectroscopies like transmission electron energy loss spectroscopy (TEELS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS), which are widely used for material analysis. This includes the intrinsic excitations due to the core hole in XPS and AES.",

keywords = "AES, electron energy loss, QUEELS software, REELS, surface effects, TEELS, XPS",

author = "Sven Tougaard and Nicolas Pauly and Francisco Yubero",

note = "Publisher Copyright: {\textcopyright} 2022 The Authors. Surface and Interface Analysis published by John Wiley & Sons Ltd.",

year = "2022",

month = jul,

doi = "10.1002/sia.7095",

language = "English",

volume = "54",

pages = "820--833",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "Wiley",

number = "7",

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T1 - QUEELS

T2 - Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

AU - Tougaard, Sven

AU - Pauly, Nicolas

AU - Yubero, Francisco

PY - 2022/7

Y1 - 2022/7

N2 - We present the user-friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response description, for swift electrons travelling nearby surfaces in several environments. We briefly describe the underlying theoretical models and illustrate its use to evaluate the distribution of energy losses taking place in electron spectroscopies like transmission electron energy loss spectroscopy (TEELS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS), which are widely used for material analysis. This includes the intrinsic excitations due to the core hole in XPS and AES.

AB - We present the user-friendly and freely available software package QUEELS (QUantitative analysis of Electron Energy Losses at Surfaces) that allows to calculate effective inelastic scattering cross sections within the dielectric response description, for swift electrons travelling nearby surfaces in several environments. We briefly describe the underlying theoretical models and illustrate its use to evaluate the distribution of energy losses taking place in electron spectroscopies like transmission electron energy loss spectroscopy (TEELS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS), which are widely used for material analysis. This includes the intrinsic excitations due to the core hole in XPS and AES.

KW - AES

KW - electron energy loss

KW - QUEELS software

KW - REELS

KW - surface effects

KW - TEELS

KW - XPS

U2 - 10.1002/sia.7095

DO - 10.1002/sia.7095

M3 - Journal article

AN - SCOPUS:85128326815

VL - 54

SP - 820

EP - 833

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 7

ER -

QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole

Abstrakt

Bibliografisk note

Dokumenter og links

Fingeraftryk

Citationsformater