Quantification of Well-characterized Langmuir-Blodgett Film by Analysis of the PeakShape of XPS taken at Different Emission Angles.

N. Suzuki, T. Kato, S. Tougaard

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    OriginalsprogEngelsk
    TidsskriftSurface and Interface Analysis
    Vol/bind31
    Sider (fra-til)862-8
    ISSN0142-2421
    DOI
    StatusUdgivet - 2001

    Citer dette

    @article{ca880ec0ba9511dc9626000ea68e967b,
    title = "Quantification of Well-characterized Langmuir-Blodgett Film by Analysis of the PeakShape of XPS taken at Different Emission Angles.",
    author = "N. Suzuki and T. Kato and S. Tougaard",
    year = "2001",
    doi = "10.1002/sia.1116",
    language = "English",
    volume = "31",
    pages = "862--8",
    journal = "Surface and Interface Analysis",
    issn = "0142-2421",
    publisher = "JohnWiley & Sons Ltd.",

    }

    Quantification of Well-characterized Langmuir-Blodgett Film by Analysis of the PeakShape of XPS taken at Different Emission Angles. / Suzuki, N.; Kato, T.; Tougaard, S.

    I: Surface and Interface Analysis, Bind 31, 2001, s. 862-8.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskning

    TY - JOUR

    T1 - Quantification of Well-characterized Langmuir-Blodgett Film by Analysis of the PeakShape of XPS taken at Different Emission Angles.

    AU - Suzuki, N.

    AU - Kato, T.

    AU - Tougaard, S.

    PY - 2001

    Y1 - 2001

    U2 - 10.1002/sia.1116

    DO - 10.1002/sia.1116

    M3 - Journal article

    VL - 31

    SP - 862

    EP - 868

    JO - Surface and Interface Analysis

    JF - Surface and Interface Analysis

    SN - 0142-2421

    ER -