Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › peer review

Originalsprog	Engelsk
Tidsskrift	Surface and Interface Analysis
Udgave nummer	38
Sider (fra-til)	604-609
ISSN	0142-2421
DOI	https://doi.org/10.1002/sia.2278
Status	Udgivet - 2006

Dokumenter og links

@article{dbf8acf0df8a11db9628000ea68e967b,

title = "Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements",

author = "Masahide Sato and Naoto Tsukamoto and Tsubasa Shiratori and Takeshi Furusawa and Noboru Suzuki and Sven Tougaard",

year = "2006",

doi = "10.1002/sia.2278",

language = "English",

pages = "604--609",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "Wiley",

number = "38",

}

TY - JOUR

T1 - Quantification and IMFP determination of multilayer Langmuir-Blodgett films by AFM and XPS measurements

AU - Sato, Masahide

AU - Tsukamoto, Naoto

AU - Shiratori, Tsubasa

AU - Furusawa, Takeshi

AU - Suzuki, Noboru

AU - Tougaard, Sven

PY - 2006

Y1 - 2006

U2 - 10.1002/sia.2278

DO - 10.1002/sia.2278

M3 - Journal article

SN - 0142-2421

SP - 604

EP - 609

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 38

ER -