Originalsprog | Engelsk |
---|---|
Tidsskrift | Microscopy and Microanalysis |
Vol/bind | 26 |
Udgave nummer | 1 |
Sider (fra-til) | 1-2 |
Antal sider | 2 |
ISSN | 1431-9276 |
DOI |
|
Status | Udgivet - feb. 2020 |
Proliferation of Faulty Materials Data Analysis in the Literature
Matthew R. Linford, Vincent S. Smentkowski*, John T. Grant, C. Richard Brundle, Peter M.A. Sherwood, Mark C. Biesinger, Jeff Terry, Kateryna Artyushkova, Alberto Herrera-Gómez, Sven Tougaard, William Skinner, Jean Jacques Pireaux, Christopher F. McConville, Christopher D. Easton, Thomas R. Gengenbach, George H. Major, Paul Dietrich, Andreas Thissen, Mark Engelhard, Cedric J. Powell
*Kontaktforfatter
- Brigham Young University
- General Electric Research
- Surface Analysis Consultant
- C. R. Brundle and Associates
- University of Washington
- University of Western Ontario
- Illinois Institute of Technology
- Physical Electronics, Inc., Minnesota
- CINVESTAV - Unidad Queretaro
- University of South Australia
- University of Namur
- RMIT University
- SPECS Surface Nano Analysis GmbH
- Pacific Northwest National Laboratory
- National Institute of Standards and Technology
- University of Maryland
- CSIRO Manufacturing
Publikation: Bidrag til tidsskrift › Kommentar/debat › Forskning › peer review