Polarization-resolved two-photon luminescence microscopy of V-groove arrays

J. Beermann, S. M. Novikov, T. Holmgaard, R. L. Eriksen, O. Albrektsen, K. Pedersen, S. I. Bozhevolnyi

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Using two-photon luminescence (TPL) microscopy and local reflection spectroscopy we investigate electromagnetic field enhancement effects from a mu m-sized composition of 450-nm-deep V-grooves milled by focused ion beam in a thick gold film and assembled to feature, within the same structure, individual V-grooves as well as one- and two-dimensional 300-nm-period arrays of, respectively, parallel and crossed V-grooves. We analyze TPL signal levels obtained at different spatial locations and with different combinations of excitation and detection polarizations, discovering that the TPL emitted from the V-grooves is polarized in the direction perpendicular to that of the V-grooves. This feature implies that the TPL occurs solely in the form of (p-polarized) surface plasmon modes and originates therefore from the very bottom of V-grooves, where no photonic modes exist. Implications of the results obtained to evaluation of local field enhancements using TPL microscopy, especially when investigating extended structures exhibiting different radiation channels, are discussed. (C)2011 Optical Society of America
OriginalsprogEngelsk
TidsskriftOptics Express
Vol/bind20
Udgave nummer1
Sider (fra-til)654-662
ISSN1094-4087
DOI
StatusUdgivet - 2012

Fingeraftryk

V grooves
luminescence
microscopy
photons
polarization
augmentation
electromagnetic fields
ion beams
photonics
gold
evaluation
radiation
spectroscopy
excitation

Citer dette

@article{a2d18eb299074ad08d0a7f485ae1b147,
title = "Polarization-resolved two-photon luminescence microscopy of V-groove arrays",
abstract = "Using two-photon luminescence (TPL) microscopy and local reflection spectroscopy we investigate electromagnetic field enhancement effects from a mu m-sized composition of 450-nm-deep V-grooves milled by focused ion beam in a thick gold film and assembled to feature, within the same structure, individual V-grooves as well as one- and two-dimensional 300-nm-period arrays of, respectively, parallel and crossed V-grooves. We analyze TPL signal levels obtained at different spatial locations and with different combinations of excitation and detection polarizations, discovering that the TPL emitted from the V-grooves is polarized in the direction perpendicular to that of the V-grooves. This feature implies that the TPL occurs solely in the form of (p-polarized) surface plasmon modes and originates therefore from the very bottom of V-grooves, where no photonic modes exist. Implications of the results obtained to evaluation of local field enhancements using TPL microscopy, especially when investigating extended structures exhibiting different radiation channels, are discussed.",
author = "J. Beermann and Novikov, {S. M.} and T. Holmgaard and Eriksen, {R. L.} and O. Albrektsen and K. Pedersen and Bozhevolnyi, {S. I.}",
year = "2012",
doi = "10.1364/OE.20.000654",
language = "English",
volume = "20",
pages = "654--662",
journal = "Optics Express",
issn = "1094-4087",
publisher = "The Optical Society",
number = "1",

}

Polarization-resolved two-photon luminescence microscopy of V-groove arrays. / Beermann, J.; Novikov, S. M.; Holmgaard, T.; Eriksen, R. L.; Albrektsen, O.; Pedersen, K.; Bozhevolnyi, S. I.

I: Optics Express, Bind 20, Nr. 1, 2012, s. 654-662.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Polarization-resolved two-photon luminescence microscopy of V-groove arrays

AU - Beermann, J.

AU - Novikov, S. M.

AU - Holmgaard, T.

AU - Eriksen, R. L.

AU - Albrektsen, O.

AU - Pedersen, K.

AU - Bozhevolnyi, S. I.

PY - 2012

Y1 - 2012

N2 - Using two-photon luminescence (TPL) microscopy and local reflection spectroscopy we investigate electromagnetic field enhancement effects from a mu m-sized composition of 450-nm-deep V-grooves milled by focused ion beam in a thick gold film and assembled to feature, within the same structure, individual V-grooves as well as one- and two-dimensional 300-nm-period arrays of, respectively, parallel and crossed V-grooves. We analyze TPL signal levels obtained at different spatial locations and with different combinations of excitation and detection polarizations, discovering that the TPL emitted from the V-grooves is polarized in the direction perpendicular to that of the V-grooves. This feature implies that the TPL occurs solely in the form of (p-polarized) surface plasmon modes and originates therefore from the very bottom of V-grooves, where no photonic modes exist. Implications of the results obtained to evaluation of local field enhancements using TPL microscopy, especially when investigating extended structures exhibiting different radiation channels, are discussed.

AB - Using two-photon luminescence (TPL) microscopy and local reflection spectroscopy we investigate electromagnetic field enhancement effects from a mu m-sized composition of 450-nm-deep V-grooves milled by focused ion beam in a thick gold film and assembled to feature, within the same structure, individual V-grooves as well as one- and two-dimensional 300-nm-period arrays of, respectively, parallel and crossed V-grooves. We analyze TPL signal levels obtained at different spatial locations and with different combinations of excitation and detection polarizations, discovering that the TPL emitted from the V-grooves is polarized in the direction perpendicular to that of the V-grooves. This feature implies that the TPL occurs solely in the form of (p-polarized) surface plasmon modes and originates therefore from the very bottom of V-grooves, where no photonic modes exist. Implications of the results obtained to evaluation of local field enhancements using TPL microscopy, especially when investigating extended structures exhibiting different radiation channels, are discussed.

U2 - 10.1364/OE.20.000654

DO - 10.1364/OE.20.000654

M3 - Journal article

VL - 20

SP - 654

EP - 662

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 1

ER -