Photo-induced Degradation Mechanisms in 4P-NPD Thin Films

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Efficiency-limiting degradation of organic compounds is one of the main bottlenecks suppressing rapid commercialization of organic optoelectronic devices. Herein, degradation mechanisms of N,N'-di-1-naphthalenyl-N,N'-diphenyl [1,1':4',1'':4'',1‴-quaterphenyl]-4,4‴-diamine (4P-NPD) — a blue emitter, host for triplet harvesting and hole transport material commonly used in a variety of organic devices, are investigated. Controlled degradation tests reveal the material stability under individual influence of air or light exposure; however, rapid and irreversible degradation when simultaneously exposed to both factors. Degradation originating from photo-induced oxidation of 4P-NPD is characterized via fluorescence lifetime measurements. At a longer degradation time of ∼60 minutes, the fluorescence lifetime is found to stabilize. Exciton diffusion-based Monte Carlo simulations show that this fluorescence lifetime stabilization does not indicate the end of the degradation process. Defect concentration simulations, based on time-resolved measurements, show that the defect formation rate decreases as the degradation progresses. This self-inhibiting behavior indicates that the photo-induced oxidation proceeds through the excited state of 4P-NPD. The results provide insight into the degradation process of 4P-NPD, highly relevant for increasing the stability of 4P-NPD-based devices.
OriginalsprogEngelsk
TidsskriftOrganic Electronics
Vol/bind63
Sider (fra-til)114-119
ISSN1566-1199
DOI
StatusUdgivet - dec. 2018

Fingeraftryk

degradation
Degradation
Thin films
thin films
Fluorescence
life (durability)
fluorescence
neodymium pyrocatechin disulfonate
Oxidation
Defects
oxidation
Diamines
commercialization
defects
diamines
optoelectronic devices
Time measurement
organic compounds
Organic compounds
Excited states

Citer dette

@article{3ea1c079812c48059ba4a7479ec45de0,
title = "Photo-induced Degradation Mechanisms in 4P-NPD Thin Films",
abstract = "Efficiency-limiting degradation of organic compounds is one of the main bottlenecks suppressing rapid commercialization of organic optoelectronic devices. Herein, degradation mechanisms of N,N'-di-1-naphthalenyl-N,N'-diphenyl [1,1':4',1'':4'',1‴-quaterphenyl]-4,4‴-diamine (4P-NPD) — a blue emitter, host for triplet harvesting and hole transport material commonly used in a variety of organic devices, are investigated. Controlled degradation tests reveal the material stability under individual influence of air or light exposure; however, rapid and irreversible degradation when simultaneously exposed to both factors. Degradation originating from photo-induced oxidation of 4P-NPD is characterized via fluorescence lifetime measurements. At a longer degradation time of ∼60 minutes, the fluorescence lifetime is found to stabilize. Exciton diffusion-based Monte Carlo simulations show that this fluorescence lifetime stabilization does not indicate the end of the degradation process. Defect concentration simulations, based on time-resolved measurements, show that the defect formation rate decreases as the degradation progresses. This self-inhibiting behavior indicates that the photo-induced oxidation proceeds through the excited state of 4P-NPD. The results provide insight into the degradation process of 4P-NPD, highly relevant for increasing the stability of 4P-NPD-based devices.",
keywords = "Photo-oxidation, degradation mechanisms, 4P-NPD thin films, time-resolved fluorescence spectroscopy, exciton diffusion Monte Carlo simulations, Exciton diffusion Monte Carlo simulations, Degradation mechanisms, Time-resolved fluorescence spectroscopy",
author = "Cielecki, {Pawel Piotr} and Jost Adam and Till Leissner and Patil, {Bhushan Ramesh} and Morten Madsen and Horst-G{\"u}nter Rubahn and Jakob Kjelstrup-Hansen and Jacek Fiutowski",
year = "2018",
month = "12",
doi = "10.1016/j.orgel.2018.08.047",
language = "English",
volume = "63",
pages = "114--119",
journal = "Organic Electronics",
issn = "1566-1199",
publisher = "Elsevier",

}

Photo-induced Degradation Mechanisms in 4P-NPD Thin Films. / Cielecki, Pawel Piotr; Adam, Jost; Leissner, Till; Patil, Bhushan Ramesh; Madsen, Morten; Rubahn, Horst-Günter; Kjelstrup-Hansen, Jakob; Fiutowski, Jacek.

I: Organic Electronics, Bind 63, 12.2018, s. 114-119.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Photo-induced Degradation Mechanisms in 4P-NPD Thin Films

AU - Cielecki, Pawel Piotr

AU - Adam, Jost

AU - Leissner, Till

AU - Patil, Bhushan Ramesh

AU - Madsen, Morten

AU - Rubahn, Horst-Günter

AU - Kjelstrup-Hansen, Jakob

AU - Fiutowski, Jacek

PY - 2018/12

Y1 - 2018/12

N2 - Efficiency-limiting degradation of organic compounds is one of the main bottlenecks suppressing rapid commercialization of organic optoelectronic devices. Herein, degradation mechanisms of N,N'-di-1-naphthalenyl-N,N'-diphenyl [1,1':4',1'':4'',1‴-quaterphenyl]-4,4‴-diamine (4P-NPD) — a blue emitter, host for triplet harvesting and hole transport material commonly used in a variety of organic devices, are investigated. Controlled degradation tests reveal the material stability under individual influence of air or light exposure; however, rapid and irreversible degradation when simultaneously exposed to both factors. Degradation originating from photo-induced oxidation of 4P-NPD is characterized via fluorescence lifetime measurements. At a longer degradation time of ∼60 minutes, the fluorescence lifetime is found to stabilize. Exciton diffusion-based Monte Carlo simulations show that this fluorescence lifetime stabilization does not indicate the end of the degradation process. Defect concentration simulations, based on time-resolved measurements, show that the defect formation rate decreases as the degradation progresses. This self-inhibiting behavior indicates that the photo-induced oxidation proceeds through the excited state of 4P-NPD. The results provide insight into the degradation process of 4P-NPD, highly relevant for increasing the stability of 4P-NPD-based devices.

AB - Efficiency-limiting degradation of organic compounds is one of the main bottlenecks suppressing rapid commercialization of organic optoelectronic devices. Herein, degradation mechanisms of N,N'-di-1-naphthalenyl-N,N'-diphenyl [1,1':4',1'':4'',1‴-quaterphenyl]-4,4‴-diamine (4P-NPD) — a blue emitter, host for triplet harvesting and hole transport material commonly used in a variety of organic devices, are investigated. Controlled degradation tests reveal the material stability under individual influence of air or light exposure; however, rapid and irreversible degradation when simultaneously exposed to both factors. Degradation originating from photo-induced oxidation of 4P-NPD is characterized via fluorescence lifetime measurements. At a longer degradation time of ∼60 minutes, the fluorescence lifetime is found to stabilize. Exciton diffusion-based Monte Carlo simulations show that this fluorescence lifetime stabilization does not indicate the end of the degradation process. Defect concentration simulations, based on time-resolved measurements, show that the defect formation rate decreases as the degradation progresses. This self-inhibiting behavior indicates that the photo-induced oxidation proceeds through the excited state of 4P-NPD. The results provide insight into the degradation process of 4P-NPD, highly relevant for increasing the stability of 4P-NPD-based devices.

KW - Photo-oxidation

KW - degradation mechanisms

KW - 4P-NPD thin films

KW - time-resolved fluorescence spectroscopy

KW - exciton diffusion Monte Carlo simulations

KW - Exciton diffusion Monte Carlo simulations

KW - Degradation mechanisms

KW - Time-resolved fluorescence spectroscopy

U2 - 10.1016/j.orgel.2018.08.047

DO - 10.1016/j.orgel.2018.08.047

M3 - Journal article

VL - 63

SP - 114

EP - 119

JO - Organic Electronics

JF - Organic Electronics

SN - 1566-1199

ER -