Optical characterization methods of thin films and nanoaggregates

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OriginalsprogEngelsk
TitelOrganic nanostructures for next generation devices
Antal sider11
Vol/bind101
Udgivelses stedBerlin
ForlagSpringer
Publikationsdato2008
Sider21-31
StatusUdgivet - 2008
NavnSpringer Series in Materials Science

Citer dette

Rubahn, H-G. (2008). Optical characterization methods of thin films and nanoaggregates. I Organic nanostructures for next generation devices (Bind 101, s. 21-31). Berlin: Springer. Springer Series in Materials Science
Rubahn, Horst-Günter. / Optical characterization methods of thin films and nanoaggregates. Organic nanostructures for next generation devices. Bind 101 Berlin : Springer, 2008. s. 21-31 (Springer Series in Materials Science).
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title = "Optical characterization methods of thin films and nanoaggregates",
author = "Horst-G{\"u}nter Rubahn",
year = "2008",
language = "English",
volume = "101",
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Rubahn, H-G 2008, Optical characterization methods of thin films and nanoaggregates. i Organic nanostructures for next generation devices. bind 101, Springer, Berlin, Springer Series in Materials Science, s. 21-31.

Optical characterization methods of thin films and nanoaggregates. / Rubahn, Horst-Günter.

Organic nanostructures for next generation devices. Bind 101 Berlin : Springer, 2008. s. 21-31 (Springer Series in Materials Science).

Publikation: Bidrag til bog/antologi/rapport/konference-proceedingBidrag til bog/antologiForskning

TY - CHAP

T1 - Optical characterization methods of thin films and nanoaggregates

AU - Rubahn, Horst-Günter

PY - 2008

Y1 - 2008

M3 - Book chapter

VL - 101

T3 - Springer Series in Materials Science

SP - 21

EP - 31

BT - Organic nanostructures for next generation devices

PB - Springer

CY - Berlin

ER -

Rubahn H-G. Optical characterization methods of thin films and nanoaggregates. I Organic nanostructures for next generation devices. Bind 101. Berlin: Springer. 2008. s. 21-31. (Springer Series in Materials Science).